2014
DOI: 10.1109/led.2013.2290120
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Control of Cu Conductive Filament in Complementary Atom Switch for Cross-Point Selector Device Application

Abstract: We present a novel approach to realize bidirectional/bipolar current-voltage characteristics for crosspoint selector device application. These utilize the instability of Cu ions in filament state for switch elements. The conductive filament instability was controlled by the compliance current with which the filament was formed. For in-situ control of the device, a complementary atom switch concept was implemented. The proposed device presents another attractive selector among the field of bidirectional selecto… Show more

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Cited by 33 publications
(25 citation statements)
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“…Titania : Being paired with either Ag or Cu electrodes, TiO 2 has exhibited threshold switching in both planar structure and vertical stacks . Song et al developed a Pt/TiO 2 /Ag cell with a dielectric film grown by atomic layer deposition (ALD) and a sputtered Ag electrode, featuring bidirectional threshold switching with <10 ns transition time (see Figure d).…”
Section: Methodsmentioning
confidence: 99%
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“…Titania : Being paired with either Ag or Cu electrodes, TiO 2 has exhibited threshold switching in both planar structure and vertical stacks . Song et al developed a Pt/TiO 2 /Ag cell with a dielectric film grown by atomic layer deposition (ALD) and a sputtered Ag electrode, featuring bidirectional threshold switching with <10 ns transition time (see Figure d).…”
Section: Methodsmentioning
confidence: 99%
“…Copyright 2015, Elsevier Ltd.) Relaxation dependence on the programming voltage/current of a m) Pt/TiO x /Cu, n) Pt/a‐La 0.3 Mn 0.7 SrO 3 /Ag, o) Pt/SiO x N y :Ag/Pt threshold switch. ((m) Reproduced with permission . Copyright 2014, IEEE.…”
Section: Temporal Response Of the Switchingmentioning
confidence: 99%
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“…The cation migration–based memristive devices are generally referred to as atomic switch or programmable metallization cell . or electrochemical metallization cell (ECM) Besides metal ions, anions migration, most commonly oxygen ions are involved in the memristive devices based on transition metal oxides without electrochemical active electrodes . The migration of oxygen ions usually induces a redox reaction expressed by a valence change of the cation sublattice and leads to a stoichiometry change of the oxides.…”
Section: Memristive Devicesmentioning
confidence: 99%