1994
DOI: 10.1063/1.111400
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Control of structure and electrical properties of lead-zirconium-titanate-based ferroelectric capacitors produced using a layer-by-layer ion beam sputter-deposition technique

Abstract: Structural and electrical characterization of microcrystalline silicon films prepared by a layer-by-layer technique with a plasma-enhanced chemical-vapor deposition system

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Cited by 81 publications
(17 citation statements)
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“…In all cases, PZT deposition was preceded by deposition of a 10 nm thick TiO 2 sacrificial barrier layer to prevent degradation of the RuO 2 surface [11], followed by a nominally 3 nm thick PbTiO 3 film allowing better perovskite nucleation [17,19]. Control of PZT orientation by in-situ sputtering require nucleation with Ti-rich compositions.…”
Section: Methodsmentioning
confidence: 99%
“…In all cases, PZT deposition was preceded by deposition of a 10 nm thick TiO 2 sacrificial barrier layer to prevent degradation of the RuO 2 surface [11], followed by a nominally 3 nm thick PbTiO 3 film allowing better perovskite nucleation [17,19]. Control of PZT orientation by in-situ sputtering require nucleation with Ti-rich compositions.…”
Section: Methodsmentioning
confidence: 99%
“…The pioneering work on RuO 2 for PZT-based capacitors was subsequently confi rmed by work performed by several groups using other electrically conductive oxide electrodes (e.g., RuO 2 [ 33 ], hybrid Pt/RuO 2 [ 34 ], La 0.5 Sr 0.5 CoO 3 (LSCO) [ 35 ], and hybrid Pt/LSCO [ 36 ]. More recently, IrO x [ 37 ] and hybrid Ir/IrO x [ 38 ] electrodes were developed to produce fatigue-free PZT capacitors, and these electrodes are being used in embedded FeRAMs, currently in commercial microcontroller systems [ 38 ].…”
Section: Sibmt-based Studies To Understand Processing-microstructurepmentioning
confidence: 98%
“…Typical parameters are given in [9,12]. For PZT, in order to enhance crystallisation and orientation, a 30 nm thick seed Ti-rich layer was deposited prior to the main PZT deposition [4,9]. …”
Section: Pt and Pzt Depositionmentioning
confidence: 99%
“…On Pt, it had been found [4,9] that a thin (30 nm) seed PT layer could nucleate growth of PZT along <100>. For RuO 2 [10], a second phase, identified as lead ruthenate (Pb 2 Ru 2 O 7 ), was seen at the RuO 2 -PZT interface.…”
Section: Introductionmentioning
confidence: 99%
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