2018
DOI: 10.1063/1.5045859
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Controlled generation of intrinsic near-infrared color centers in 4H-SiC via proton irradiation and annealing

Abstract: We report on the generation and annihilation of color centers in 4H silicon carbide (SiC) by proton irradiation and subsequent annealing. Using low-temperature photoluminescence (PL), we study the transformation of PL spectra for different proton doses and annealing temperatures. Among well reported defect signatures, we observe omnipresent but not yet identified PL signatures consisting of three sharp and temperature stable lines (denoted TS1,2,3) at 768.8 nm, 812.0 nm, and 813.3 nm. These lines show a strong… Show more

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Cited by 50 publications
(38 citation statements)
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“…The room-temperature PL shows an enhancement by a factor of up to 5.5 for V Si in sample 1 and by a factor of 2.3 for V Si V C in sample 3. Our results also confirm the conversion of V Si to V Si V C during annealing [55] from sample 2 to sample 3. The enhancement of V Si in sample 2 appears to be lower than that in sample 1.…”
Section: Methodssupporting
confidence: 86%
See 1 more Smart Citation
“…The room-temperature PL shows an enhancement by a factor of up to 5.5 for V Si in sample 1 and by a factor of 2.3 for V Si V C in sample 3. Our results also confirm the conversion of V Si to V Si V C during annealing [55] from sample 2 to sample 3. The enhancement of V Si in sample 2 appears to be lower than that in sample 1.…”
Section: Methodssupporting
confidence: 86%
“…A larger background was observed in samples 2 and 3, compared to samples 1 and 4. This is probably because the annealing may induce another emission with ZPLs around 820 nm and a sideband in our detection region [55].…”
Section: Resultsmentioning
confidence: 99%
“…Quenching mechanism of V Si creation were also observed in proton-writing of V Si [ 47 , 48 ] and laser writing [ 14 ]. Annealing at moderate temperature may reduce the concentration of the V C and improve the radiative lifetime time of the emitters, however, high-temperature annealing also convert the V Si in C Si V C [ 49 ] and divacancy [ 50 ] and possibly other defects are also formed [ 45 ].…”
Section: Resultsmentioning
confidence: 99%
“…The approach also proved useful for creating emitters at about 100 nm from the surface using a 60 keV proton beam. Generation and annihilation of color centers in 4H SiC by proton irradiation and annealing are also reported in [114]. Using low-temperature PL, they suggest a defect transformation, with proton irradiation first generating isolated silicon vacancies, then transformed into CAV complexes, finally transformed into likely intrinsic-related defects.…”
Section: Defects Fabrication: Materials Growth and Irradiationmentioning
confidence: 90%
“…Furthermore, their unknown origin impedes their ondemand fabrication. Passivation methods have been adopted for their removal based on graphene layer growth at 1650°C in argon ambient and annealing in the presence of no gas [114]. A dramatic improvement in photostability and an enhancement in the emission of SiC CAV was achieved after the growth of an epitaxial AlN passivation layer.…”
Section: Optically and Electrically Driven Single Photon Sources (Spss)mentioning
confidence: 99%