Half-Heusler(HH) alloys have shown promising thermoelectric properties in the medium and high temperature range. To harness these material properties for thermoelectric applications, it is important to realize electrical contacts with low electrical contact resistivity. However, little is known about the detailed structural and electronic properties of such contacts, and the expected values of contact resistivity. Here, we employ atomistic ab initio calculations to study electrical contacts in a subclass of HH alloys consisting of the compounds HfCoSb, HfZrCoSb, and HfZrNiSn. By using Ag as a prototypical metal, we show that the termination of the HH material critically determines the presence or absence of strong deformations at the interface. Our study includes contacts to doped materials, and the results indicate that the p-type materials generally form ohmic contacts while the n-type materials have a small Schottky barrier. We calculate the temperature dependence of the contact resistivity in the low to medium temperature range and provide quantitative values that set lower limits for these systems. where h max =(T H -T C )/T H is the Carnot efficiency, T H and T C are the hot and cold side temperatures, and ZT is a dimensionless figure of merit that characterizes the TE performance of materials. For the efficiency of a TE device, ZT is an average of the ZT values for the n-type and p-type TE materials. The material ZT is given by ("#) %&' = * + ,#/. , where σ is the electrical conductivity, S the Seebeck coefficient, and κ the thermal conductivity. Equation 1 is valid in the ideal situation where the thermal and electrical contact resistivity at the hot and cold ends are negligible [2]. In reality, the finite electrical and thermal contact resistivities lead to both temperature and voltage drops at the hot and cold ends, hence reduce the overall device efficiency, which is proportional to the effective figure of merit (ZT) 233 = ZT * [1 + +r 8 9 : ; : ] => , where ZT is the device level figure of merit without contact effects, r C is the contact resistivity, r m and L m are the resistivity and length of the p-type and n-type TE materials for the legs in the TE module. Thus, for optimal device performance, the contact resistivity should be as small as possible; a rule of thumb is that a good module performance requires r C