2017
DOI: 10.1002/prep.201700008
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Controlled Substrate Destruction Using Nanothermite

Abstract: The experiments described in this paper look to further transient electronic device development by exploring the fracturing capabilities of aluminum copper (II) oxide and aluminum bismuth (III) oxide nanothermites. In particular, a quick, inexpensive test was developed that was able to characterize the substrate fracturing capability of these selectively deposited energetic materials. Using this test, aluminum bismuth (III) oxide nanothermite with near stoichiometric composition was shown to be an effective ma… Show more

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Cited by 20 publications
(19 citation statements)
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“…A range of fragmentation of representative silicon substrates was expected to be seen by varying the equivalence ratio. This range of destruction would then indicate the fracturing performance of a given nanothermite mixture at several equivalence ratios, as it did in previous substrate shattering experiments [13]. Equivalence ratio is defined by…”
Section: Nanothermite Preparationmentioning
confidence: 81%
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“…A range of fragmentation of representative silicon substrates was expected to be seen by varying the equivalence ratio. This range of destruction would then indicate the fracturing performance of a given nanothermite mixture at several equivalence ratios, as it did in previous substrate shattering experiments [13]. Equivalence ratio is defined by…”
Section: Nanothermite Preparationmentioning
confidence: 81%
“…Fragments of the silicon substrates were collected post-event to characterize the fracturing performance. A range of equivalence ratios of Al/Bi 2 O 3 nanothermite were tested to compare to previous unconfined nanothermite experiments performed by Fleck et al over a similar range [13]. In the current study, Al/CuO nanothermite was prepared at f = 1 only with the goal of observing any fracturing of the silicon wafers with this fuel/oxidizer formulation since, from previous work and thermochemical calculations, we anticipated the best fracturing performance for a stoichiometric equivalence ratio.…”
Section: Substrate Destructionmentioning
confidence: 92%
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