Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes

Bobrinetskii, I. I.; Nevolin, V. K.; Stroganov, A. A.; Chaplygin, Yu. A.

doi:10.1023/b:rumi.0000043045.98569.10

Cited by 2 publications

(1 citation statement)

References 19 publications

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“…Scanning probe microscopy is a precision method for studying the electrical properties of horizontal carbon nanotubes [33][34][35]. However, the study of vertically aligned carbon nanotube has difficulties due to the mobility of nanotubes upon contact with the SPM probe and the formation of VA CNT bundles on the application of an electric field [36].…”

Section: A Technique For Determining the Resistivity Of Vertically Almentioning

confidence: 99%

Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Il’ina¹,

Il’in²,

Smirnov³

et al. 2019

Atomic-Force Microscopy and Its Applications

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This chapter presents the results of experimental studies of the electrical, mechanical and geometric parameters of vertically aligned carbon nanotubes (VA CNTs) using scanning probe microscopy (SPM). This chapter also presents the features and difficulties of characterization of VA CNTs in different scanning modes of the SPM. Advanced techniques for VA CNT characterization (the height, Young's modulus, resistivity, adhesion and piezoelectric response) taking into account the features of the SPM modes are described. The proposed techniques allow to overcome the difficulties associated with the vertical orientation and high aspect ratio of nanotubes in determining the electrical and mechanical parameters of the VA CNTs by standard methods. The results can be used in the development of diagnostic methods as well as in nanoelectronics and nanosystem devices based on vertically aligned carbon nanotubes (memory elements, adhesive structures, nanoelectromechanical switches, emission structures, etc.).

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Section: A Technique For Determining the Resistivity Of Vertically Almentioning

confidence: 99%

Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Il’ina¹,

Il’in²,

Smirnov³

et al. 2019

Atomic-Force Microscopy and Its Applications

View full text Add to dashboard Cite

show abstract

Resistive Switching of Vertically Aligned Carbon Nanotubes for Advanced Nanoelectronic Devices

Агеев¹,

Blinov²,

Il’ina³

et al. 2016

Intelligent Nanomaterials

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Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes

Cited by 2 publications

References 19 publications

Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes

Resistive Switching of Vertically Aligned Carbon Nanotubes for Advanced Nanoelectronic Devices

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