2009
DOI: 10.1016/j.eswa.2008.08.064
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Controlling over-adjusted process means and variances using VSI cause selecting control charts

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Cited by 15 publications
(9 citation statements)
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“…Yang and Su proposed the VSS Ztruex¯ and Z ē , VSI Ztruex¯ and Z ē , and VSSI Ztruex¯ and Z ē charts to monitor the process means on the dependent first process step and second process step, respectively. Yang and Chen proposed the joint VSI Ztruex¯Zsx2 and Z ē – Zse2 to monitor both the processes means and variances while Yang and Chen and Yang proposed the same scheme to monitor the processes means and variances when the process may be unnecessarily adjusted.…”
Section: Adaptive Shewhart Control Chartsmentioning
confidence: 99%
See 1 more Smart Citation
“…Yang and Su proposed the VSS Ztruex¯ and Z ē , VSI Ztruex¯ and Z ē , and VSSI Ztruex¯ and Z ē charts to monitor the process means on the dependent first process step and second process step, respectively. Yang and Chen proposed the joint VSI Ztruex¯Zsx2 and Z ē – Zse2 to monitor both the processes means and variances while Yang and Chen and Yang proposed the same scheme to monitor the processes means and variances when the process may be unnecessarily adjusted.…”
Section: Adaptive Shewhart Control Chartsmentioning
confidence: 99%
“…However, we may be interested in detecting shifts in both the process mean and variance. Yang and Chen and Yang proposed the joint VSI ΖtrueX¯ZS2 and Ζtruee¯ZSe2 control charts to control the mean and variance of two dependent process steps.…”
Section: Adaptive Shewhart Control Chartsmentioning
confidence: 99%
“…For the adaptive approach in variable charts, it has been shown to give substantially faster detection of most process shifts than the traditional charts (see Bai and Lee, 2002;Costa, 1994Costa, , 1999Rahim, 2006, Costa andMagalhaes, 2007;Lina and Chou, 2005;Prabhu et al, 1994;Reynolds and Stoumbos, 2001;Yang and Chen, 2009;Yang and Rahim, 2005;Yang and Su, 2007;Yang et al, 2010;Wu et al, 2007;Zhang and Wu, 2006;Zimmer et al, 1998Zimmer et al, , 2000. For the traditional attributes charts, in the previous works, they are based on the conforming run length (CRL) to detect the out-of-control condition by checking the number of nonconforming unit or nonconformities in a sample (see Bourke, 1991Bourke, , 2001Kaminsky et al, 1992;Wu and Spedding, 2000;Wu et al, 2001a, b).…”
Section: Introductionmentioning
confidence: 98%
“…To simultaneously monitor the process mean and variance, several studies of adaptive control charts have suggested using adaptive rather than fixed control schemes, and other studies have proposed double or single adaptive charts . To enhance the ability of the proposed single FSI WL chart to detect out‐of‐control loss, a variable sampling interval (VSI) control scheme is included in the WL chart.…”
Section: Introductionmentioning
confidence: 99%