“…[10][11][12][13] AFM is particularly advantageous in that it can be used either to look at crystal surfaces following synthesis (ex-situ) or in solution during growth (in-situ). AFM investigations of natural zeolites [14][15][16] and synthetic zeolites such as zeolite A, [17,18] silicalite-1, [19,20] zeolite Y [21] and zeolite L [22] have indicated a layer-by-layer growth mechanism, in which the particles add to the terrace edges, forming kinks followed by expansion of the terrace and simultaneous surface nucleation. The surface structure of silicalite-1 prepared using two different templates, that is, the tetrapropylammonium ion (TPA) and trimeric TPA, have also been elucidated by employing HRTEM and AFM techniques.…”