2018
DOI: 10.1021/acsphotonics.7b01553
|View full text |Cite
|
Sign up to set email alerts
|

Controlling the Plasmonic Properties of Ultrathin TiN Films at the Atomic Level

Abstract: By combining first principles theoretical calculations and experimental optical and structural characterization such as spectroscopic ellipsometry, X-ray spectroscopy, and electron microscopy, we study the dielectric permittivity and plasmonic properties of ultrathin TiN films at an atomistic level. Our results indicate a remarkably persistent metallic character of ultrathin TiN films and a progressive red shift of the plasmon energy as the thickness of the film is reduced. The microscopic origin of this trend… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

8
83
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 88 publications
(91 citation statements)
references
References 62 publications
8
83
0
Order By: Relevance
“…The greater share of the interest has been devoted to Ti x N, which was recognized as being capable of sustaining SPPs since at least 1994, although interest in its ability to sustain LSPRs seems to have only started in earnest in 2010 . There has been significant subsequent work since then . One important difference between these nitrides and actual metallic systems, however, is that the nitrides generally have a very variable stoichiometry, carrier concentration and defect structure, which in turn controls their dielectric function, and hence the degree to which they are “metallic.” In the case of Ti x N, properties ranging from highly metallic to almost an insulating dielectric can be obtained by varying the deposition parameters—typically nitrogen flow rate or substrate temperature .…”
Section: Compounds Between Metals and Nonmetalsmentioning
confidence: 99%
“…The greater share of the interest has been devoted to Ti x N, which was recognized as being capable of sustaining SPPs since at least 1994, although interest in its ability to sustain LSPRs seems to have only started in earnest in 2010 . There has been significant subsequent work since then . One important difference between these nitrides and actual metallic systems, however, is that the nitrides generally have a very variable stoichiometry, carrier concentration and defect structure, which in turn controls their dielectric function, and hence the degree to which they are “metallic.” In the case of Ti x N, properties ranging from highly metallic to almost an insulating dielectric can be obtained by varying the deposition parameters—typically nitrogen flow rate or substrate temperature .…”
Section: Compounds Between Metals and Nonmetalsmentioning
confidence: 99%
“…The current research has been largely focusing on either purely 2D structures including metal-dielectric interfaces and novel 2D materials [7,8], or on conventional bulk materials, being guided by the traditional view that only the dimensionality and chemical composition are important to control the optoelectronic properties of materials. The transitional, transdimensional regime laying in between 3D and 2D, has been largely out of the major research focus so far.Ultrathin films made of metals, doped semiconductors, or polar materials with a thickness of only a few atomic layers, can support plasmon-, exciton-, and phonon-polariton eigenmodes [6][7][8][9][10][11][12][13]. Such TD materials are therefore expected to show the high tailorability of their electronic and optical properties by varying their thickness (number of monolayers), chemical, atomic and electronic composition (stoichiometry, doping) as opposed to conventional thin films usually described by the bulk material properties with boundary conditions imposed.…”
mentioning
confidence: 99%
“…To ensure a good metallic and continuous TiN film deposited on an amorphous Si layer by sputtering, thickness = 10 nm was chosen for the TiN MIM structure. Note that a good metallic and continuous TiN film below 10 nm can be fabricated by sputtering either using a lattice‐matched substrate42,43 or depositing with high power impulse magnetron sputtering (HiPIMS) technique44,45 at high process temperatures. The resonance of the MIM structure stems from the interference where the resonance wavelength can be adjusted by changing the cavity length 46,47.…”
Section: Planar Multilayer Structures; Tin Mim and Tin Tppmentioning
confidence: 99%