Controlling tip–sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFM

Parlak, Zehra; Hadizadeh, Rameen; Balantekin, M.; Degertekin, F. Levent

doi:10.1016/j.ultramic.2009.04.006

Cited by 13 publications

(3 citation statements)

References 15 publications

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“…The solution of this problem can be obtained by the method of detection of certain interaction responsible for the tip-sample contact. Concerning available information in the developed system, the peak force can be used [20], which is related specifically to the moment when the sample is pressed by the tip. Therefore we have replaced the RMS amplitude signal typically used in the AFM system with the peak force signal delivered by the auxiliary computational unit.…”

Section: Mv)mentioning

confidence: 99%

“…By doing this, one can obtain immunity of the system to phenomena introducing unwanted interactions and generating artifacts. Such an idea was also proposed by Parlak et al [20]; however, the main issue of the method is the setup complexity which is a major limitation in its practical utilization. In this paper we present the approach which is based on a relatively small modification of the commercial AFM system.…”

Section: Introductionmentioning

confidence: 99%

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Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements

Sikora

Bednarz

2011

Meas. Sci. Technol.

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The intermittent contact mode, also known as tapping mode, is the most popular AFM measurement technique due to limited force acting on the observed surface and the scanning tip. The tip–sample interaction detection method suffers, however, from the complexity of the forces causing the amplitude and phase change when the tip approaches the surface. In this paper we present the utilization of the time-resolved tip–sample interaction detection technique allowing imaging of the mechanical properties of the sample under the reduced influence of the force applied to the surface on its imaging. Observation of certain phenomena related to the tip–sample contact event, the so-called peak force value, allows us to notice the presence of the feature's height measurement error. Moreover, when the setpoint is changed, the distribution of the peak force map also varies, indicating the altered response of the material to the pressure caused by the tip. Eventually, when the roughness of the surface is calculated, it may vary as well. In this paper, we also propose the utilization of measurement of the maximum force the tip has on the surface during every oscillation cycle as the Z-axis feedback signal in order to improve the measurement technique and reduce the described issue. The experimental data are presented as well.

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Section: Mv)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements

Sikora

Bednarz

2011

Meas. Sci. Technol.

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“…It should be underlined that the application area of such a tip-sample force detection method potentially reaches beyond the measurement of the surface's specific properties and it may also be used to improve the detection of the tip-sample interaction [21,22]. There is, however, a serious issue of the calibration of the cantilever's spring constant because quantitative information about the measured force is desired.…”

Section: Introductionmentioning

confidence: 99%

The determination of the spring constant of T-shaped cantilevers using calibration structures

Sikora

Bednarz

Ekwiński³

et al. 2014

Meas. Sci. Technol.

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One of the most important diagnostic features of atomic force microscopy is the measurement of mechanical properties of the surface. Among a wide spectra of measuring techniques, the methods utilizing torsional oscillations of the cantilever provide high speed mapping of properties such as the stiffness, adhesion, snap-in force and energy dissipation. In order to perform quantitative measurements, one must determine the spring constant of the cantilever. In this paper, we present the utilization of high-accuracy normal force calibration structures, allowing the procedure to be carried out easily and quickly. Additionally, the results of tests confirming the efficiency of the method are presented.

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2010

Amplitude Modulation Atomic Force Microscopy

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Controlling tip–sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFM

Cited by 13 publications

References 15 publications

Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements

Direct measurement and control of peak tapping forces in atomic force microscopy for improved height measurements

The determination of the spring constant of T-shaped cantilevers using calibration structures

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