Copper sample analyzed with an <i>n</i>-doped silicon tip using conducting probe atomic force microscopy

Schneegans, Olivier; Boyer, L.; Houzé, Frédéric; Meyer, René; Chrétien, Pascal

doi:10.1116/1.1502702

Cited by 4 publications

(1 citation statement)

References 22 publications

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“…A potential complication in measurements of impedance and current as a function of applied bias can occur in AFMs with laser-based feedback due to photoexcitation of carriers in the probe and/or the sample. This effect has been observed in both silicon (Buh and Kopanski, 2003) and copper samples (Schneegans et al, 2002), where it was mentioned that the magnitude varies with both the position and intensity of the laser. Buh and Kopanski (2003) also reported that carrier lifetimes can be measured from the transient behavior induced by turning off the laser.…”

Section: Ac C-afm Techniquesmentioning

confidence: 81%

Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials

Greene

Kinser

Kramer

et al. 2004

Microscopy Res & Technique

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Scanning probe microscopy (SPM) is a widely used experimental technique for characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to spatially map variations in materials properties with nanometer spatial resolution, SPM is particularly well suited to probe the subcomponents and interfaces of hybrid nanomaterials, i.e., materials that are made up of distinct nanometer scale components with distinguishable properties. In addition, the interaction of the SPM tip with materials can be intentionally tuned such that local surface modification is achieved. In this manner, hybrid nanostructures can also be fabricated on solid substrates using SPM. This report reviews recent developments in the characterization and fabrication of hybrid nanomaterials with SPM. Specific attention is given to nanomaterials that consist of both organic and inorganic components including individual biomolecules mounted on inorganic substrates. SPM techniques that are particularly well suited for characterizing the mechanical and electrical properties of such hybrid systems in atmospheric pressure environments are highlighted, and specific illustrative examples are provided. This review concludes with a brief discussion of the remaining challenges and promising future prospects for this field.

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Section: Ac C-afm Techniquesmentioning

confidence: 81%

Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials

Greene

Kinser

Kramer

et al. 2004

Microscopy Res & Technique

View full text Add to dashboard Cite

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Energy harvesting efficiency in GaN nanowire-based nanogenerators: the critical influence of the Schottky nanocontact

et al. 2017

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The performances of 1D-nanostructure based nanogenerators are governed by the ability of nanostructures to efficiently convert mechanical deformation into electrical energy, and by the efficiency with which this piezo-generated energy is harvested. In this paper, we highlight the crucial influence of the GaN nanowire-metal Schottky nanocontact on the energy harvesting efficiency. Three different metals, p-type doped diamond, PtSi and Pt/Ir, have been investigated. By using an atomic force microscope equipped with a Resiscope module, we demonstrate that the harvesting of piezo-generated energy is up to 2.4 times more efficient using a platinum-based Schottky nanocontact compared to a doped diamond-based nanocontact. In light of Schottky contact characteristics, we evidence that the conventional description of the Schottky diode cannot be applied. The contact is governed by its nanometer size. This specific behaviour induces notably a lowering of the Schottky barrier height, which gives rise to an enhanced conduction. We especially demonstrate that this effective thinning is directly correlated with the improvement of the energy harvesting efficiency, which is much pronounced for Pt-based Schottky diodes. These results constitute a building block to the overall improvement of NW-based nanogenerator devices.

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Laser assisted field induced oxide nanopatterning of hydrogen passivated silicon surfaces

Pingree

Schmitz

Kramer

et al. 2007

Applied Physics Letters

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Field induced oxide (FIO) nanopatterning of hydrogen passivated silicon surfaces with an atomic force microscope (AFM) has been controlled by laser irradiation. Specifically, local oxidation on H:Si(111) surfaces can be fully suppressed or activated by toggling a laser that is illuminating a lightly doped silicon AFM cantilever. The nanopatterning mechanism is attributed to the control of the free carrier concentration in the AFM probe by the laser. When the laser is toggled off, charge injection is terminated, thus eliminating the electrochemical reactions required for oxide formation. Laser assisted FIO provides an alternative and flexible means for controlling oxide nanopatterning.

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Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

Abstract: Articles you may be interested inElectrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy

Cited by 4 publications

References 22 publications

Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials

Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials

Energy harvesting efficiency in GaN nanowire-based nanogenerators: the critical influence of the Schottky nanocontact

Laser assisted field induced oxide nanopatterning of hydrogen passivated silicon surfaces

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