Core level photoelectron spectromicroscopy with Al Kα1 excitation at 500nm spatial resolution

Renault, O.; Lavayssière, Maylis; Bailly, Aude; Mariolle, D.; Barrett, N.

doi:10.1016/j.elspec.2009.03.008

Cited by 22 publications

(16 citation statements)

References 19 publications

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“…The inset in the figure displays the Ge 2p 3/2 XPS signal averaged over the area inside the yellow rectangle in the lower part of the image that the lateral resolution measured at the SiGe/Si interface, from the analysis of the step in the intensity of the Ge2p 3/2 signal according to ISO standards, is less than 500 nm. [5] This constitutes an improvement of nearly one order of magnitude with respect to existing data. In another experiment (Fig.…”

Section: Lateral Resolution Of Core-level Imagesmentioning

confidence: 87%

“…Details of the preparation are given elsewhere. [5] Fig. 3 shows a single-energy XPEEM image of the cross-section of 3 µm wide epitaxial Si 0.5 Ge 0.5 layers, recorded at a photoelectron energy of 266.4 eV corresponding to the Ge 2p 3/2 transition (binding energy ∼1218 eV).…”

Section: Lateral Resolution Of Core-level Imagesmentioning

confidence: 99%

“…[5] It is the aim of this paper to review the present solutions in the field of XPS imaging with laboratory instrumentation and to highlight the recent progress performed in laboratory X-ray PEEM (XPEEM), which paves the way to laterally resolved XPS in the 100 nm range. In the perspectives, we will show how, unlike presently existing microscopic methods using photoelectrons, a wide range of complementary techniques can be used in laboratory XPEEM, such as secondary electron and valence band imaging in direct and reciprocal space, for the mapping of local work function and of electronic properties of materials.…”

Section: Introductionmentioning

confidence: 99%

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High‐resolution XPS spectromicroscopy

Renault

2010

Surface & Interface Analysis

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The field of XPS imaging and spectromicroscopy has recently made significant progress thanks to laboratory X-ray photoelectron emission microscopy (XPEEM), a novel, versatile parallel imaging method for which lateral resolution of core-level images in the 500 nm range, and spectromicroscopy from decanometric-size area of interest have been demonstrated (J. Electron Spectroc. Relat. Phenom. 171 (2009), 68). It uses a bright microfocussed monochromated Al Kα source and a photoelectron emission microscope (PEEM) as entrance lens of a high-transmission, aberration-compensated imaging spectrometer in the form of a double hemispherical analyzer. In this paper, restricted to laboratory aspects of XPS spectromicroscopy, we will first give some details of this novel instrumentation after a short historical review of the field until the presently existing imaging techniques. Then, some of the first results of laboratory core-level XPEEM on practical samples will be presented. Future perspectives towards quantitative analysis, improvements of lateral resolution and multitechnique spectromicroscopic aspects with laboratory sources (including UPS spectromicroscopy in direct and reciprocal space) will be drawn.

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Section: Lateral Resolution Of Core-level Imagesmentioning

confidence: 87%

Section: Lateral Resolution Of Core-level Imagesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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High‐resolution XPS spectromicroscopy

Renault

2010

Surface & Interface Analysis

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“…The recent advent of XPS with high spatial resolution (40 to 500 nm) [1,2], as implemented in XPEEM (X-ray Photoelectron Emission Microscopy) spectromicroscopy paves the way to many applications in devices and micro-systems [3][4][5]. A novel operation mode of the PEEM, k-PEEM, was recently introduced for fast band structure investigations by spectroscopic imaging of valence electrons in the reciprocal space [6].…”

Section: Introductionmentioning

confidence: 99%

Recent Advances In 2D-Band Structure Imaging By k-PEEM and Prospects For Technological Materials

Mathieu¹,

Renault²,

Rotella³

et al. 2011

AIP Conference Proceedings

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“…The details about operating procedures and principles are discussed by Heun et al [68]. New-generation XPEEM is represented by an instrument that is equipped with bandpass energy filter and is capable of providing high lateral resolution at around 0.5 µm with an X-ray source [69,70]. Kang et al [71] studied outward diffusion of Cr and Cr 2 O 3 , which occurred due to the carbon precipitation in 304 stainless steel.…”

Section: (F) Electron Probe Microanalysismentioning

confidence: 99%

Emerging surface characterization techniques for carbon steel corrosion: a critical brief review

2017

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Carbon steel is a preferred construction material in many industrial and domestic applications, including oil and gas pipelines, where corrosion mitigation using film-forming corrosion inhibitor formulations is a widely accepted method. This review identifies surface analytical techniques that are considered suitable for analysis of thin films at metallic substrates, but are yet to be applied to analysis of carbon steel surfaces in corrosive media or treated with corrosion inhibitors. The reviewed methods include time of flight-secondary ion mass spectrometry, X-ray absorption spectroscopy methods, particle-induced X-ray emission, Rutherford backscatter spectroscopy, Auger electron spectroscopy, electron probe microanalysis, near-edge X-ray absorption fine structure spectroscopy, X-ray photoemission electron microscopy, low-energy electron diffraction, small-angle neutron scattering and neutron reflectometry, and conversion electron Moessbauer spectrometry. Advantages and limitations of the analytical methods in thin-film surface investigations are discussed. Technical parameters of nominated analytical methods are provided to assist in the selection of suitable methods for analysis of metallic substrates deposited with surface films. The challenges associated with the applications of the emerging analytical methods in corrosion science are also addressed.

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Core level photoelectron spectromicroscopy with Al Kα1 excitation at 500nm spatial resolution

Cited by 22 publications

References 19 publications

High‐resolution XPS spectromicroscopy

High‐resolution XPS spectromicroscopy

Recent Advances In 2D-Band Structure Imaging By k-PEEM and Prospects For Technological Materials

Emerging surface characterization techniques for carbon steel corrosion: a critical brief review

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