2014
DOI: 10.1016/j.orgel.2014.06.018
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Correcting for contact geometry in Seebeck coefficient measurements of thin film devices

Abstract: Driven by promising recent results, there has been a revived interest in the thermoelectric properties of organic (semi) conductors. Concomitantly, there is a need to probe the Seebeck coefficient S of modestly conducting materials in thin film geometry. Here we show that geometries that seem desirable from a signal-to-noise perspective may induce systematic errors in the measured value of S, S-m, by a factor 3 or more. The enhancement of S-m by the device geometry is related to competing conduction paths outs… Show more

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Cited by 68 publications
(62 citation statements)
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“…This is to avoid contributions to the thermo-voltage from outside the active area, which can cause the Seebeck coefficient to be overestimated. 22 The crystalline domains are observed using Atomic Force Microscopy (AFM) to be up to 1 µm in diameter (Figure 1(b)). Top contacts are evaporated through a shadow mask (7 nm of MoO 3 and 25 nm of Au).…”
mentioning
confidence: 99%
“…This is to avoid contributions to the thermo-voltage from outside the active area, which can cause the Seebeck coefficient to be overestimated. 22 The crystalline domains are observed using Atomic Force Microscopy (AFM) to be up to 1 µm in diameter (Figure 1(b)). Top contacts are evaporated through a shadow mask (7 nm of MoO 3 and 25 nm of Au).…”
mentioning
confidence: 99%
“…We believe that these relatively large values have, apart from lab-to-lab and batch-to-batch variations, to do with the used contact geometry as discussed in detail in Ref. [17]. …”
Section: Resultsmentioning
confidence: 98%
“…The device geometry used in our experiments is expected to give rise to an overestimation of S by a factor 1.3 according to Ref. [17]. The Seebeck coefficients reported here are corrected by this factor.…”
Section: Electrical Characterizationmentioning
confidence: 87%
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“…For instance, Seebeck coeicient can vary signiicantly, when electrodes with diferent geometries are used during the measurement. It was shown, that variation in electrode geometry can inluence Seebeck coeicient by a factor of 3 or more [74]. Regarding electrical conductivity, it is known that diferent methods, for example, van der Pauw or linear 4-point-probe, can result in diferent sheet resistances because of possible anisotropies in the samples.…”
Section: Optimization Of Seebeck Coeicientmentioning
confidence: 99%