“…Table 3 In order to determine the far-field of the test antenna by "deconvoluting" the measured near-field data (without knowing the detailed scattering properties of the probe or test antenna), the multiple reflections must be neglected. That is, the second and higher order terms in the infinite series just described are assumed negligible when applying the planar near-field scanning techniques [3], Multiple reflections can be reduced by decreasing the size of the probe antenna, by increasing the distance between the probe and test antenna, and by appropriately covering the scanning range with efficient absorber material. These measures will not, however, 14 eliminate the multiple reflections entirely.…”