Correlated Electro-Optical and Structural Study of Electrically Tunable Nanowire Quantum Dot Emitters

Spies, Maria; Ajay, Akhil; Monroy, E.; Gayral, B.; Hertog, M. den

doi:10.1021/acs.nanolett.9b03858

Cited by 4 publications

(4 citation statements)

References 37 publications

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“…In reference [43], STEM observations, photocurrent and µ-PL measurements under bias were performed on the same specimen, a GaN NW which contains a single AlN/GaN/AlN quantum disc structure, as sketched in figure 10(a). The corresponding band profile of the het- erostructure is given in figure 10(b).…”

Section: Review Of Studies Based On Custom Membrane-chipsmentioning

confidence: 99%

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Correlated and in-situ electrical transmission electron microscopy studies and related membrane-chip fabrication

Spies¹,

Momtaz²,

Lähnemann³

et al. 2020

Nanotechnology

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Understanding the interplay between the structure, composition and opto-electronic properties of semiconductor nano-objects requires combining transmission electron microscopy (TEM) based techniques with electrical and optical measurements on the very same specimen. Recent developments in TEM technologies allow not only the identification and in-situ electrical characterization of a particular object, but also the direct visualization of its modification in-situ by techniques such as Joule heating. Over the past years, we have carried out a number of studies in these fields that are reviewed in this contribution. In particular, we discuss here i) correlated studies where the same unique object is characterized electro-optically and by TEM, ii) in-situ Joule heating studies where a solid-state metal-semiconductor reaction is monitored in the TEM, and iii) in-situ biasing studies to better understand the electrical properties of contacted single nanowires. In addition, we provide detailed fabrication steps for the silicon nitride membrane-chips crucial to these correlated and in-situ measurements.

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Section: Review Of Studies Based On Custom Membrane-chipsmentioning

confidence: 99%

“…The zero bias measurement is indicated in magenta.The spectra are given without normalization and shifted vertically for clarity. Reprinted with permission from[43] Copyright 2020 American Chemical Society.…”

mentioning

confidence: 99%

Correlated and in-situ electrical transmission electron microscopy studies and related membrane-chip fabrication

Spies¹,

Momtaz²,

Lähnemann³

et al. 2020

Nanotechnology

Self Cite

View full text Add to dashboard Cite

show abstract

“…In reference [40], STEM observations, photocurrent and µ-PL measurements under bias were performed on the same specimen, a GaN NW which contains a single AlN/GaN/AlN quantum disc structure, as sketched in figure 10(a). The corresponding band profile of the heterostructure is given in figure 10(b).…”

Section: Review Of Studies Based On Custom Membranesmentioning

confidence: 99%

“…The zero bias measurement is indicated in magenta.The spectra are given without normalization and shifted vertically for clarity. Adapted from reference[40] with permission from ACS.…”

mentioning

confidence: 99%

Correlated and in-situ electrical transmission electron microscopy studies and related membrane fabrication

Spies,

Sadre-Momtaz,

Lähnemann

et al. 2020

Preprint

Self Cite

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Understanding the interplay between the structure, composition and opto-electronic properties of semiconductor nano-objects requires combining transmission electron microscopy (TEM) based techniques with electrical and optical measurements on the very same specimen. Recent developments in TEM technologies allow not only the identification and in-situ electrical characterization of a particular object, but also the direct visualization of its modification in-situ by techniques such as Joule heating. Over the past years, we have carried out a number of studies in these fields that are reviewed in this contribution. In particular, we discuss here i) correlated studies where the same unique object is characterized electro-optically and by TEM, ii) in-situ Joule heating studies where a solid-state metal-semiconductor reaction is monitored in the TEM, and iii) in-situ biasing studies to better understand the electrical properties of contacted single nanowires. In addition, we provide detailed fabrication steps for the silicon nitride membranes crucial to these correlated and in-situ measurements.

show abstract

Investigation of the confined states and oscillator strength of conical quantum dots with wetting layer embedded in nanowire

Rahimi

Vahdani

2022

Opt Quant Electron

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Correlated Electro-Optical and Structural Study of Electrically Tunable Nanowire Quantum Dot Emitters

Cited by 4 publications

References 37 publications

Correlated and in-situ electrical transmission electron microscopy studies and related membrane-chip fabrication

Correlated and in-situ electrical transmission electron microscopy studies and related membrane-chip fabrication

Correlated and in-situ electrical transmission electron microscopy studies and related membrane fabrication

Investigation of the confined states and oscillator strength of conical quantum dots with wetting layer embedded in nanowire

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