1994
DOI: 10.1063/1.112744
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Correlation between distribution of outgrowths and microwave surface resistance for YBa2Cu3O7 thin films

Abstract: A model was proposed to describe the effects of surface outgrowths on the microwave surface resistance of high Tc superconducting thin films. Calculated with experimental data the microwave surface resistance at 10 GHz for c-axis oriented YBa2Cu3O7 thin films with no outgrowths could be as low as 70 and 4 μΩ at 77 and 4.2 K, respectively. The effect of the orientation of the surface outgrowths on the microwave loss has been discussed.

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Cited by 19 publications
(2 citation statements)
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“…Furthermore, reduction in the of YBCO films might accompany improved nonlinear properties, for which extensive studies have been performed by many researchers [4], [5]. There have been reports that disorder [6], defects [7], outgrowths [8] films. However, to our knowledge, a definitive way to change the of YBCO films in a reproducible way is yet to be reported.…”
Section: Introductionmentioning
confidence: 97%
“…Furthermore, reduction in the of YBCO films might accompany improved nonlinear properties, for which extensive studies have been performed by many researchers [4], [5]. There have been reports that disorder [6], defects [7], outgrowths [8] films. However, to our knowledge, a definitive way to change the of YBCO films in a reproducible way is yet to be reported.…”
Section: Introductionmentioning
confidence: 97%
“…In recent years a lot of studies, applied and fundamental, have been devoted to this subject. It was found out that YBCO film electrical properties can sufficiently depend on the following structural and phase inhomogeneities: boundaries of twins, grains and microblocks [2,3]; domains with high angle misorientation [4] and a-oriented domains [5]; domains with oxygen nonstoichiometric [6]; stacking faults [7]; cation disorder in the YBCO cell [8,9] and secondary phase particles [10]. It is obvious that for development of advanced techniques of high quality YBCO film preparation it is necessary to know how much each kind of inhomogeneity affects certain electrical parameters of films during optimization of deposition conditions.…”
Section: Introductionmentioning
confidence: 99%