2004
DOI: 10.1116/1.1710489
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Correlation between nanostructure and electron emission characteristics of a ballistic electron surface-emitting device

Abstract: Articles you may be interested inSub-50 nm resolution surface electron emission lithography using nano-Si ballistic electron emitter

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Cited by 25 publications
(11 citation statements)
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“…9 In atmospheric pressures, especially in air, the current induced oxidation of the nc-Si layer would produce the interfacial defects resulting in electron trap and scattering loss. The multiple tunneling along the nanodot chains is a key factor for stable ballistic transport and emission.…”
Section: Resultsmentioning
confidence: 99%
“…9 In atmospheric pressures, especially in air, the current induced oxidation of the nc-Si layer would produce the interfacial defects resulting in electron trap and scattering loss. The multiple tunneling along the nanodot chains is a key factor for stable ballistic transport and emission.…”
Section: Resultsmentioning
confidence: 99%
“…Energetic electrons are generated via multiple-tunnel transport through a chain of nc-Si dots interconnected with thin oxide films. [1][2][3][4] The mean energy of emitted electrons is strongly affected by the nanostructure in the device where chainlike nc-Si structures are produced along columnar poly-Si grains. In the well-controlled device, the current-voltage (I-V) curves behave in the way expected from the tunneling mode with little scattering energy losses.…”
Section: Introductionmentioning
confidence: 99%
“…In the well-controlled device, the current-voltage (I-V) curves behave in the way expected from the tunneling mode with little scattering energy losses. 3 The electron emission characteristics are insensitive to vacuum pressure, thus it can be driven in a gaseous atmosphere. This feature makes it possible to apply the nc-Si cathode to discharge devices such as fluorescent lamps.…”
Section: Introductionmentioning
confidence: 99%
“…The emission mechanism is based on the ballistic electron transport in the nc-Si layer, [3][4][5][6] where electrons are accelerated via multitunneling cascade followed by ejection into vacuum through a thin top contact. The mean energy of output electrons reaches 5-7 eV at applied voltages of 15-20 V. This nc-Si ballistic planar emitter has several advantages: ͑i͒ highly energetic and directional emitted electrons; 7 ͑ii͒ compatibility with silicon planar processing at low temperatures; ͑iii͒ relatively low operating voltage; ͑iv͒ insensitivity to vacuum pressure; 8 ͑v͒ quick dynamic response; 9 and ͑vi͒ availability for emitter array fabrication on large-area glass substrate.…”
mentioning
confidence: 99%