Cosmic ray soft error rates of 16-Mb DRAM memory chips

Ziegler, J. F.; Nelson, Martin E.; Shell, J.D.; Peterson, R. J.; Gelderloos, C. J.; Muhlfeld, H. P.; Montrose, C. J.

doi:10.1109/4.658626

Cited by 68 publications

(48 citation statements)

References 25 publications

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“…3. The third approach is to use a proton beam as an approximation of neutrons at energies 50-100 MeV and above [61], [62]. The advantage of a proton beam is its wide availability.…”

Section: Neutron-induced Sermentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

447

211

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Abstract-Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in highperformance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon, charge collection effects, soft errors, and their effect on VLSI circuits. We also discuss the impact of SEUs on system reliability. We describe an accelerated measurement of SERs using a high-intensity neutron beam, the characterization of SERs in sequential logic cells, and technology scaling trends. Finally, some directions for future research are given.

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“…3. The third approach is to use a proton beam as an approximation of neutrons at energies 50-100 MeV and above [61], [62]. The advantage of a proton beam is its wide availability.…”

Section: Neutron-induced Sermentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

447

211

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“…In this section, we revisit checkpoint protocols in the context of silent errors, also called silent data corruption. Such errors must be accounted for when executing HPC applications [61,76,74,75,58]. The cause for silent errors may be for instance soft efforts in L1 cache, or bit flips due to cosmic radiation.…”

Section: Motivationmentioning

confidence: 99%

Fault-Tolerance Techniques for High-Performance Computing

2015

Computer Communications and Networks

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This report provides an introduction to resilience methods. The emphasis is on checkpointing, the de-facto standard technique for resilience in High Performance Computing. We present the main two protocols, namely coordinated checkpointing and hierarchical checkpointing. Then we introduce performance models and use them to assess the performance of theses protocols. We cover the Young/Daly formula for the optimal period and much more! Next we explain how the efficiency of checkpointing can be improved via fault prediction or replication. Then we move to application-specific methods, such as ABFT. We conclude the report by discussing techniques to cope with silent errors (or silent data corruption).This report is a slightly modified version of the first chapter of the monograph Fault tolerance techniques for high-performance computing edited by Thomas Herault and Yves Robert, and to be published by Springer Verlag.

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“…This large concern, especially with the Soft Error (SE) occurrences on ICs, has resulted in a lot of researches for measuring, estimating and evaluating the Soft Error Rate (SER) of semiconductor devices. Many works characterize and evaluate the SE effects on ICs like those in (HARBOE-SORENSEN;SUND, 1992;KAROUI;CHAPUIS, 1992;NORMAND et al, 1994;TOSAKA et al, 1998;ZIEGLER et al, 1998;BAUMANN, 2001;HOWARD et al, 2001;LIMA et al, -b, 2002DODD et al, 2002;MAIZ et al, 2003;KARNIK;PATEL, 2004;LERAY et al, 2004;LAMBERT et al, 2004;CONSTANTINESCU, 2005;SAGGESE et al, 2005).…”

Section: Occurrence Rate Of Radiation-induced Effectsmentioning

confidence: 99%