A strain-gauge-type precision displacement sensor, which is developed for positioning of a micro-XY stage, is described in this paper. The designed patterns of Cr-N strain gauges are directly sputtered on zirconia plates, which would be used as leaf springs in the micro-XY stage, by using photolithography processes to form a Wheatstone bridge circuit. The patterns of the strain gauges on the leaf spring are optimized to be sensitive area so that the displacement of the stage can be measured with a higher sensitivity. The experimental results confirmed that the designed sensor is applicable for sub-micrometre-scale positioning of the micro-XY stage.