“…The accurate P-S-N results can be obtained by the TM method only when the sample size is large enough. [8][9][10] More importantly, P-S-N curves will be even more costly and more time-consuming when facing the situation of large-Nomenclature: A, B, m, fitting parameters of P-S-N curves; C, confidence level; CV i , coefficient of variation of the logarithmic fatigue life at the ith stress level; ESS, explained sum of squares; EQ, new method for determining P-S-N curves in terms of equivalent fatigue lives; F (), cumulative distribution functions; I, number of testing stress levels; ISO, International Standard Organisation; J i , number of all the experimental life data at the ith stress level; k, one-sided tolerance limit factor; l i , number of the experimental life data used for P-S-N curve fitting at the ith stress level; N, lgN, fatigue lives, and logarithmic fatigue lives; N i,j , fatigue life of the specimen j at the ith stress level; N ω , lgN ω , fatigue lives, and logarithmic fatigue lives of the mixed sample at the baseline stress level; lgN C,R,i , logarithmic fatigue with the confidence level C and survival level R; lg(N C,R,i ) f , lg(N C,R,i ) a , fitted logarithmic fatigue lives, and accurate logarithmic fatigue lives with the confidence level C and survival level R at the ith stress level; Φ, cumulative distribution function of the standard normal distribution; μ i , μ Base , median logarithmic fatigue life at the ith stress level, and at the baseline stress level; R, survival level; RSS, residual sum of squares; S i , stress level with the order of i; TM, traditional method for determining P-S-N curves; σ i , standard deviation of the logarithmic fatigue life at the ith stress level; t, testing time; U, unified coefficient of variation; v, sample size of the mixed sample; w, fatigue life order for the mixed sample; χ, precision level scatter data, [11][12][13] because fatigue failure is sensitive to many factors such as microstructure and defects of materials as well as specimen surface quality. [14][15][16] Therefore, it is of great necessity to propose a new method for determining P-S-N curves, which can save testing time and improve testing efficiency.…”