2010
DOI: 10.1016/j.snb.2010.07.034
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Critical-angle refractometer enhanced by periodic multilayer coating

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Cited by 6 publications
(1 citation statement)
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“…Measuring local refractive-index values, , is extremely important due to the fast development of quantum- and nanotechnologies, as well as materials and life sciences. If the sample or its characteristic structures have sizes below the wavelength of light, the usual, and some advanced (e.g., refs and ), refractometry techniques are not applicable. Certain progress has recently been reported in ref , where computer simulations demonstrated that n fluctuations on subdiffraction length scales can be extracted from the analysis of scattered light.…”
mentioning
confidence: 99%
“…Measuring local refractive-index values, , is extremely important due to the fast development of quantum- and nanotechnologies, as well as materials and life sciences. If the sample or its characteristic structures have sizes below the wavelength of light, the usual, and some advanced (e.g., refs and ), refractometry techniques are not applicable. Certain progress has recently been reported in ref , where computer simulations demonstrated that n fluctuations on subdiffraction length scales can be extracted from the analysis of scattered light.…”
mentioning
confidence: 99%