“…Geometrical optics (GO) ray-tracing methods incorporating aperture field integration (AFI) or diffraction approaches, such as GO + AFI [6,7] and geometrical theory of diffraction [8], are attractive in analysing electrically large reflectors because of the high calculation efficiency, however, bearing limited accuracy. On the other hand, direct integration (DI) methods, such as physical optics (PO) [9,10], can offer more accurate results in high-frequency analysis of reflectors, but with much more computation costs. As a consequence, the accelerating techniques for PO have been intensively studied, and several fast PO treatments have been developed [11][12][13][14][15] as well as hybrid approaches [16,17].…”