Abstract:Differential cross section of X-ray production induced by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV have been measured for thin targets of Ti, Fe, Zn, Nb and Ta in a direct way. A fully characterized silicon drift diode was used as Xrays detector. Beam currents have been measured by a system of two Faraday cups. Corrections for target thickness effects have been applied to the raw data. Experimental cross sections are compared both with theory and with previously published results. Experimen… Show more
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