2011
DOI: 10.1016/j.sab.2011.05.007
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Crossover and valence band Kβ X-rays of chromium oxides

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Cited by 25 publications
(10 citation statements)
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“…The latter is not unexpected, as the observed intensity of these lines are strongly influence by sample geometry and the structure of the absorption coefficient, as measured in XANES. [74,[90][91][92][93] The issue of sample re-absorption of fluorescence prior to escape is also important in the shape of the Kβ 2,5 emission peak as its high-energy side often straddles the rising K-edge. This creates an important systematic effect in thick samples; fluorescence above the absorption edge is preferentially quenched when escaping outward from the sample bulk.…”
Section: Second Inmentioning
confidence: 99%
“…The latter is not unexpected, as the observed intensity of these lines are strongly influence by sample geometry and the structure of the absorption coefficient, as measured in XANES. [74,[90][91][92][93] The issue of sample re-absorption of fluorescence prior to escape is also important in the shape of the Kβ 2,5 emission peak as its high-energy side often straddles the rising K-edge. This creates an important systematic effect in thick samples; fluorescence above the absorption edge is preferentially quenched when escaping outward from the sample bulk.…”
Section: Second Inmentioning
confidence: 99%
“…Unlike XAS and RIXS, valenceto-core measurements do not require a monochromatic and tunable x-ray source and therefore can be applied for chemical investigations using laboratory sources. 23,24 Furthermore, no need for the beam monochromacity makes valence-to-core spectroscopy a well suitable technique for x-ray free electron laser sources (XFEL). The XFEL source provides a very intense femtosecond x-ray pulse, which has a large energy bandwidth ( E/E∼0.2%) and a large variation of the shotto-shot mean energy.…”
Section: Introductionmentioning
confidence: 99%
“…But in principle there should be effects similar in PIXE as have been exploited in XPS (and XRF and other techniques) for the last several decades. The chemical shift between the oxide, nitride and carbide of the Si Kα line were measured at 0.2, 0.4 and 0.55eV respectively with a wavelength dispersive system [101], the S Kα line shifts over 1 eV for sulphates [102], and the Ni K-line absorption-edge energy was found to shift to higher values by about 1.5 eV per unit change in valency of nickel [103]; chemical shifts for Kβ [104] [105] are up to 2 eV per unit change in valency, and those for L lines are similar. For example, about 1 eV/valency was observed by sy-XAFS for Ti Lα lines [106].…”
Section: Chemical Analysis With Ibamentioning
confidence: 99%