2019
DOI: 10.1364/ome.9.002117
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Cryogenic characterization of titanium nitride thin films

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Cited by 25 publications
(34 citation statements)
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“…The plasma frequency is measured by ellipsometry at room temperature, the coherence length is determined using the relation (ξ 0 ) 2 = −Φ 0 (dB c2 /dT ) −1 /2πT c from the temperature dependencies of the second critical magnetic field B c2 (T ), see the Figure 4(c). The transport relaxation time is estimated as τ tr = 1/(ρ 10K ω 2 p ε 0 ), assuming that ω p is temperature independent [46]. Note that in our analysis of the size-effect in the residual resistance we excluded the Mayadas-Shatzkes (MS) model [47], which focuses on the scattering of electrons at grain boundaries in polycrystalline thin films.…”
Section: Resultsmentioning
confidence: 99%
“…The plasma frequency is measured by ellipsometry at room temperature, the coherence length is determined using the relation (ξ 0 ) 2 = −Φ 0 (dB c2 /dT ) −1 /2πT c from the temperature dependencies of the second critical magnetic field B c2 (T ), see the Figure 4(c). The transport relaxation time is estimated as τ tr = 1/(ρ 10K ω 2 p ε 0 ), assuming that ω p is temperature independent [46]. Note that in our analysis of the size-effect in the residual resistance we excluded the Mayadas-Shatzkes (MS) model [47], which focuses on the scattering of electrons at grain boundaries in polycrystalline thin films.…”
Section: Resultsmentioning
confidence: 99%
“…(1). For metals at frequencies below the interband transition frequencies, ε is known to be ∼ 10 in magnitude, being contributed both by the positive background of ions and by the interband transitions to some extent [19,26]. Under continuous low-intensity light illumination the plasmonic film can still be treated as being at the thermal equilibrium.…”
mentioning
confidence: 99%
“…Within its applicability domain, Eq. (3) can be used to obtain ε and/or k c with C being treated as a parameter to fit experimental data in terms of the standard local Drude model, which is typically the case in relevant experiments [4,26].…”
mentioning
confidence: 99%
“…The measured FTIR reflection and fitted reflection spectra by using the RefFit software 44,74,75 are shown in Fig. 3 and supplementary material at [URL will be inserted by AIP Publishing].…”
Section: Optical Properties/permittivitiesmentioning
confidence: 99%