Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 2003
DOI: 10.1109/bipol.2003.1274960
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Cryogenic performance of a 200 GHz SiGe HBT technology

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Cited by 16 publications
(1 citation statement)
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“…Moreover, Cressler and co-workers [8,[21][22][23]30,31] presented the direct current (DC) measurements of the IBM 1st to 4th generation SiGe HBTs operating in cryogenic temperature regime. Especially, a highly scaled 90 nm SiGe HBT operating at temperature as low as 70 mK has been demonstrated [23].…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, Cressler and co-workers [8,[21][22][23]30,31] presented the direct current (DC) measurements of the IBM 1st to 4th generation SiGe HBTs operating in cryogenic temperature regime. Especially, a highly scaled 90 nm SiGe HBT operating at temperature as low as 70 mK has been demonstrated [23].…”
Section: Introductionmentioning
confidence: 99%