2015
DOI: 10.1016/j.physb.2015.05.023
|View full text |Cite
|
Sign up to set email alerts
|

Crystal imperfections and Mott parameters of sprayed nanostructure IrO2 thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
16
0
2

Year Published

2015
2015
2023
2023

Publication Types

Select...
10

Relationship

1
9

Authors

Journals

citations
Cited by 66 publications
(18 citation statements)
references
References 51 publications
0
16
0
2
Order By: Relevance
“…On the other hand, X-ray diffraction is considered a suitable method for checking the crystalline/amorphous nature of thin films, especially if the scanning rate is a continuous and slow. Moreover X-ray diffractograms give good and sufficient information about the nature of forming thin films rather than it is a low cost, fast, easy method and a very reliable technique [27][28][29]. This communication is a continuation of previous research works where authors studied nanostructure, optical and electrical properties of thermally evaporated CdS 0.1 Se 0.9 polycrystalline thin films with different thickness in one article [24] and in another work they studied the microstructure and crystalline imperfections of the ternary chalcogenide systems of CdS X Se 1−X thin films with compositions where 0.0≤x≤0.4 [27].…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…On the other hand, X-ray diffraction is considered a suitable method for checking the crystalline/amorphous nature of thin films, especially if the scanning rate is a continuous and slow. Moreover X-ray diffractograms give good and sufficient information about the nature of forming thin films rather than it is a low cost, fast, easy method and a very reliable technique [27][28][29]. This communication is a continuation of previous research works where authors studied nanostructure, optical and electrical properties of thermally evaporated CdS 0.1 Se 0.9 polycrystalline thin films with different thickness in one article [24] and in another work they studied the microstructure and crystalline imperfections of the ternary chalcogenide systems of CdS X Se 1−X thin films with compositions where 0.0≤x≤0.4 [27].…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…The XRD analysis results indicated that the Ni -(cubic ZrO 2 ) phases of nanocomposite coating are crystalline structures. Table 2 shows the crystallite size of nanocomposite coating is calculated for pure Ni matrix coating compared with Ni-ZrO 2 nanocomposite coating grains of stainless steel 316L substrate at a different weight percentage of nanoparticles utilized Debye-Scherrer's equation, given by [10].…”
Section: X-ray Diffraction (Xrd) Resultsmentioning
confidence: 99%
“…Under the action of an electric field, addition of Al 2 O 3 will increase the leakage current density of the composite ceramics, because Al 2 O 3 forms a liquid phase at grain boundaries between the ferroelectric and ferromagnetic phases during the sintering process, causing some carriers to concentrate at the grain boundaries. 47 Under the action of an external electric field, these carriers will move directionally, resulting in an increase in the leakage current. When the Al 2 O 3 content was 3%, the leakage current was the largest.…”
Section: Ferroelectric Propertiesmentioning
confidence: 99%