Crystal perfection in Czochralski grown nickel single crystals

Kuriyama, M.; Boettinger, William J.; Burdette, Harold E.

doi:10.1016/0022-0248(78)90385-8

Cited by 11 publications

(2 citation statements)

References 24 publications

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“…In order to study a variety of single crystals, other than nearly perfect semiconductors or quartz crystals, the non-parallel (+,-) or (+,+) settings were used by Bearden & Henins (1965), Deslattes (1968), Kohra, Hashizume & Yoshimura (1970), Yoshimura etal. (1976), Kuriyama, Boettinger & Burdette (1978) and Strocka & Willich (1982). In spite of the large volume of cxpcrimental work on DCT only Jfiger (1965Jfiger ( , 1966 has attempted to analyze in detail the problem of the influence of diffraction geometry on image formation.…”

Section: Introductionmentioning

confidence: 99%

Analysis of X-ray diffraction conditions for double-crystal topography

Kuo¹,

Bilello²

1984

J Appl Cryst

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In recent years, with the advent of nearly perfect crystals, double-crystal topography has become very useful. For applications with such crystals the diffraction geometry in the double-crystal arrangement in three dimensions should be taken into account. Detailed studies of this problem are presented in this paper. Formulas for calculating the image height and displacement as the crystal is rotated are reported for various conditions. In the equispacing case, the image height is not limited provided the sample crystal is untilted with respect to the first crystal. However, if the crystal is tilted even a small amount then the image is limited and depends not only on the tilt angle ~ but also on the distance between the X-ray source and the crystal L and on the degree of crystal perfection ft. In general, the tilt angle should not exceed 1' to obtain a large-area topograph and to measure the correct rocking curve in the asymmetric mode. In the unequispacing case, the image height is always limited. In this case, even when the crystal is not tilted, the image height is a function of L, ~o and the difference in Bragg angle, AO, between the diffraction planes of the two crystals. The image height is directly proportional to fl and inversely related to AO. In this case, in order to obtain a large-area topograph of a nearly perfect crystal L must be large or A O must be small. The different experimental conditions are explored for various types of first and second crystals to verify the analytical formulas that have been derived. The experimental data were found to be in good agreement qualitatively and quantitatively with the analysis.

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Section: Introductionmentioning

confidence: 99%

Analysis of X-ray diffraction conditions for double-crystal topography

Kuo¹,

Bilello²

1984

J Appl Cryst

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“…An example of this phenomenon is shown in Fig. 1 for a (110) nickel crystal surface cut through a reasonably cylindrical specimen solidified along [010] by the Czochralski method (Kuriyama, Boettinger & Burdette, 1978). Fig.…”

Section: Introductionmentioning

confidence: 99%

Crystal subgrain misorientations observed by X-ray topography in reflection

Armstrong¹,

Boettinger²,

Kuriyama³

1980

J Appl Cryst

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Based on the principles of conservation of momentum and energy for X-ray diffraction, a vector description is obtained for the displacement of adjacent subgrain images in reflection topographs. The analysis includes, in addition to those crystal parameters defining the misorientation at a subgrain boundary, the combined effects of (horizontal and vertical) divergence in the incident X-ray beam and of the position where the Xray images are recorded. The vector description is matched with a stereographic projection method of analysis for describing the subgrain misorientations. These total considerations are applied to the characterization of subgrain boundaries grown into a nickel single crystal solidified along [-010], including specification of the dislocation structure within the boundaries.

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Laboratory Techniques for X-ray Reflection Topography

Armstrong¹

1980

Characterization of Crystal Growth Defects by X-Ray Methods

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Crystal perfection in Czochralski grown nickel single crystals

Cited by 11 publications

References 24 publications

Analysis of X-ray diffraction conditions for double-crystal topography

Analysis of X-ray diffraction conditions for double-crystal topography

Crystal subgrain misorientations observed by X-ray topography in reflection

Laboratory Techniques for X-ray Reflection Topography

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