2012
DOI: 10.1016/j.tsf.2012.06.043
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Crystallization and electrical resistivity of Cu2O and CuO obtained by thermal oxidation of Cu thin films on SiO2/Si substrates

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Cited by 276 publications
(94 citation statements)
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“…The resistivity of the films annealed at 200 o C is decreased from 4.714 ×10 3 Ω.cm to 1.261×10 3 Ω.cm for the increase in annealing temperature to 300 o C. This maybe due to the excess oxygen content in the copper oxide. Drobny and Pulfrey reported that during the transition from Cu2O to CuO, the CuO sites will act as electrically neutral defects which replace the electrically active copper vacancies thus resulting in the decrease of the resistivity [10]. The resistivity is then decreased slightly to 0.2835×10 3 Ω.cm with increasing annealing temperature at 450 o C which consists of tenorite phase.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…The resistivity of the films annealed at 200 o C is decreased from 4.714 ×10 3 Ω.cm to 1.261×10 3 Ω.cm for the increase in annealing temperature to 300 o C. This maybe due to the excess oxygen content in the copper oxide. Drobny and Pulfrey reported that during the transition from Cu2O to CuO, the CuO sites will act as electrically neutral defects which replace the electrically active copper vacancies thus resulting in the decrease of the resistivity [10]. The resistivity is then decreased slightly to 0.2835×10 3 Ω.cm with increasing annealing temperature at 450 o C which consists of tenorite phase.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…20,21 Furthermore, we have recently shown that the appearance of a ferromagnetic moment on nominally antiferromagnetic NiO nanoparticles can be attributed to a disordered shell (surface) possessing a significant polarizable magnetization. [31][32][33] This consists in annealing metal surfaces at high temperatures in air flow or in oxygen atmosphere to obtain the partial (or complete, as desired) oxidation of the metal films. 30 However, in most of these techniques, it is difficult to control the amount of oxidation.…”
Section: Introductionmentioning
confidence: 99%
“…While the use of CO as ac apping agent is indeed crucial for achieving quality dispersion of formed PtCu NPs using GD reaction of Cu/C with K 2 PtCl 4 in aqueous media, the mechanism behind double passivation method is much more complex:First, the first passivation involves the passivation of Cu by spontaneous growth of the oxides (Scheme 1a;see also XRD spectra in the Supporting Information, Figure S10). A passive oxide layer lowers the conductance [22] between the water phase and Cu. Second, upon introduction of K 2 PtCl 4 , GD reaction between Pt precursor and oxide-passivated Cu is initiated.…”
mentioning
confidence: 99%