A Cu 2 ZnSnS 4 (CZTS) thin film was fabricated by co-evaporation of its constituents (Cu, Zn, Sn, and S) and subsequent annealing in S-flux using molecular beam epitaxy system. Two Sn crucible temperatures were considered, 1,010 and 1,020°C. The Raman spectrum of the sample exhibited the main peaks at 336 cm %1 attributed to CZTS and 472 cm %1 attributed to Cu 2%x S. The annealing temperature that yielded CZTS with a lower amount of Cu 2%x S was in the range of 380-420°C. The peaks of the Cu 2%x S phase were not observed in the sample fabricated at the Sn crucible temperature of 1,020°C and annealed at 420°C. The suppression of the Cu segregation near the surface, yielded a suppression of the Cu 2%x S phase, as revealed by the Raman spectra. The increase of the Sn ratio, achieved by increasing the crucible temperature, contributed to the suppression of the Cu 2%x S phase and improvement of the CZTS crystalline quality.