Cu 2 ZnSnS 4 (CZTS) thin films were synthesised on glass substrates by sulphurising sputtered metallic precursors in H 2 S + N 2 atmosphere at 500 °C. The influences of the radio frequency (RF) sputtering power on the structure, surface morphology, optical and electrical properties of the thin films were investigated. Scanning electron microscopy, X-ray diffraction, Raman and UV-vis NIR spectroscopy were used to characterise the films. All the CZTS thin films exhibited a dominant kesterite structure. With increasing sputtering power, secondary phases in the films reduced, and the surface became more compact. The optimum quality films with poor-Cu and rich-Zn were obtained when the sputtering power was 90 W, and the optical band gap, carrier concentration, resistivity and mobility were 1.47 eV, 2.07 × 10 18 cm −3 , 2.37 Ω cm and 1.38 cm 2 s −1 v −1 , respectively. The optical and electrical properties of the CZTS thin films in relation to the secondary phases were discussed.