Photoinduced interfacial charge carrier generation, separation, trapping, and recombination in TiO 2 ͉In 2 S 3 ͉CuInS 2 cells have been studied with time-resolved microwave conductivity ͑TRMC͒. Single layer, double layer, and complete triple layer configurations have been studied. Selective electronic excitation in one of the components is accomplished by using monochromatic pulsed laser excitation. In bare CuInS 2 films and in TiO 2 ͉ CuInS 2 double layers, photoinduced charge carriers recombine on a subnanosecond time scale. This fast recombination slows down significantly when an In 2 S 3 buffer layer is applied between TiO 2 and CuInS 2 . In that case, the charge separation lifetime increases by more than one order of magnitude. A superlinear dependence of the TRMC signals on the incident laser intensity is observed for the triple layer configuration, which indicates saturation of electron traps in In 2 S 3 or hole traps in CuInS 2 . Furthermore, TRMC signals from TiO 2 ͉In 2 S 3 ͉CuInS 2 triple junctions and those from In 2 S 3 ͉ CuInS 2 double layers are identical, which shows that charge carrier separation exclusively takes place at the In 2 S 3 ͉ CuInS 2 interface.