1988
DOI: 10.1002/crat.2170230236
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CuInSe2 epitaxial layers with sphalerite structure

Abstract: Bulk CuInSe, at 1083 K has a reversible phase transition of first order from the ordered chalcopyrite to the disordered sphalerite structure ( MOLLER et al. 1985). In epitaxial layers deposited on (111)-oriented GaAs and Ge substrates by the flash evaporation technique (SCHUMANN et al. 1978a(SCHUMANN et al. , 1980a) the sphalerite phase was observed already a t lower substrate temperatures (Tab. 1). This sphalerite structure is stable a t room temperature in contrast t o the bulk material and can be detected … Show more

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Cited by 2 publications
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“…Reaching 22.6% efficiency [1], they are the most efficient polycrystalline thin-film solar cells available today [2]. The epitaxial growth of CISe on single crystal substrates, including GaAs [3][4][5], Si [6], Ge [5,7] GaP [8], GaN [9], and ZnSe [10] has been investigated by different groups. Also the improvement of the growth mode with different deposition techniques [11][12][13] has been investigated to grow epitaxial layers of CuInSe 2 , in which a lattice-matched substrate results in a reduction of structural defects and roughness in the CISe films.…”
Section: Introductionmentioning
confidence: 99%
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“…Reaching 22.6% efficiency [1], they are the most efficient polycrystalline thin-film solar cells available today [2]. The epitaxial growth of CISe on single crystal substrates, including GaAs [3][4][5], Si [6], Ge [5,7] GaP [8], GaN [9], and ZnSe [10] has been investigated by different groups. Also the improvement of the growth mode with different deposition techniques [11][12][13] has been investigated to grow epitaxial layers of CuInSe 2 , in which a lattice-matched substrate results in a reduction of structural defects and roughness in the CISe films.…”
Section: Introductionmentioning
confidence: 99%
“…In situ RHEED images of the GaAs (001) surface after oxide removal by depositing In at T s = 530 °C for (a) the[1][2][3][4][5][6][7][8][9][10] and (b) the [110] azimuths. RHEED images after the deposition of ~1.5 nm (18 deposition cycles of (Cu+In) and Se) by MEE at 530 ºC for (c) [1-10], (d) [110], and (e) [100] azimuths with respect to the GaAs substrate.…”
mentioning
confidence: 99%