2010
DOI: 10.1063/1.3294329
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Current fluctuations in three-dimensionally stacked Si nanocrystals thin films

Abstract: In this letter, we report a phenomenon of the current fluctuations by measuring lateral conduction of the three-dimensionally stacked Si nanocrystal (SiNC) thin films based on thin film transistor structures. Through measuring current-voltage (I-V) characteristics, drain-source current (Ids) exhibits fluctuations in particular gate voltage (Vg) and drain voltage (Vds) ranges. The experimental results show that the characteristics of the current fluctuations are changed with changing the charging situations of … Show more

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Cited by 7 publications
(8 citation statements)
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“…Once particles reached the desired size, they were extracted from the plasma cell by a pulse of hydrogen gas . As shown in Figure , the nanocrystals left the plasma cell through an orifice and enter an ultrahigh vacuum chamber where they were deposited on a substrate to fabricate thin films. In a recent study, the authors used emission spectroscopy to characterize this plasma . They noticed that there was a clear correlation between the increase in argon line intensity and the generation of silicon nanocrystals.…”
Section: Practical Implementation Of Synthesis Reactorsmentioning
confidence: 99%
“…Once particles reached the desired size, they were extracted from the plasma cell by a pulse of hydrogen gas . As shown in Figure , the nanocrystals left the plasma cell through an orifice and enter an ultrahigh vacuum chamber where they were deposited on a substrate to fabricate thin films. In a recent study, the authors used emission spectroscopy to characterize this plasma . They noticed that there was a clear correlation between the increase in argon line intensity and the generation of silicon nanocrystals.…”
Section: Practical Implementation Of Synthesis Reactorsmentioning
confidence: 99%
“…In recent years, silicon nanostructures have attracted enormous attentions. [1][2][3][4][5] Particularly, metal-insulatorsemiconductor (MIS) structures based on silicon quantum dots are widely studied for their new physical phenomena as well as their potential applications in future memory device. The first nanocrystals based MIS memory structure was put forward by Tiwari et al, where Si nanocrystals were used as storage nodes.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, silicon nanocrystals (SiNCs) have attracted much attention from researchers because of their unique quantum behavior, 1) electrical and optical properties, 2,3) room-temperature fabrication, [4][5][6][7][8][9] and potential for low-cost mass production. 10,11) There are many promising applications of SiNC-based devices, such as single-electron transistors, 12) light-emitting devices, [13][14][15] optical interconnections, 16) electron emitters, 16) flexible display devices, thinfilm transistors, 17) high-speed radio frequency identifications (RFIDs), 18) floating-gate memories, 19) quantum information processing devices, 20) and high-efficiency solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…However, SiNC-based devices suffer from very low electrical conductivity [4][5][6][7][8][9] owing to the high surface reactivity of SiNCs, the large number of tunneling barriers provided by each of the SiNCs along conduction paths, and the formation of numerous voids inside the film. Firstly, a natural oxide layer with a thickness in the range of 1-2 nm is formed on the surface of SiNCs.…”
Section: Introductionmentioning
confidence: 99%