2002
DOI: 10.1063/1.1469665
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Cyclotron frequency coupled enhancement of Kerr rotation in low refractive index-dielectric/magneto-optic bilayer thin-film structures

Abstract: We investigate the enhancement of magneto-optic polar Kerr rotation over a broad range of optical frequencies. The Drude model for the dielectric tensor is considered. Resonance-like peaks in the Kerr rotation and ellipticity caused in the vicinity of a plasma edge is extended throughout the visible spectrum by deriving an expression for the cyclotron frequency such that Re(⑀ xx )ϳ1 at any given incident photon energy and plasma frequency of the material. The Kerr rotation obtained by use of this expression wa… Show more

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Cited by 14 publications
(8 citation statements)
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“…From this most commonly used expression for calculating MOKE, it can be seen that MOKE resonances should occur when xx = 1. This is also where R ± goes to zero and the MOKE resonance occurs near ω = ω p [67][68][69]. Note that similarly, magneto-plasmons in graphene give large magneto optic effects [70,71].…”
Section: Magneto-opticsmentioning
confidence: 95%
“…From this most commonly used expression for calculating MOKE, it can be seen that MOKE resonances should occur when xx = 1. This is also where R ± goes to zero and the MOKE resonance occurs near ω = ω p [67][68][69]. Note that similarly, magneto-plasmons in graphene give large magneto optic effects [70,71].…”
Section: Magneto-opticsmentioning
confidence: 95%
“…Then, it is easy to understand that when K is constant, a reduced R should result in an enhanced ͉ K ͉. However, enhanced ͉ K ͉ ͑at a given value of x m ͒ does not always imply reduced R. 3,4 For example, x m = 100 Å here is an exception. Part of the reason, as mentioned later, is that ͉ K ͉ is enhanced alternatively by an increase in K, while keeping R constant.…”
Section: Resultsmentioning
confidence: 93%
“…Since then, there has been great advancement of both theoetical [2][3][4] and experimental 5 understanding of the polar Kerr rotation ͑PKR͒ and of the surface plasma resonance ͑SPR͒. In particular, it was shown in Ref.…”
Section: Introductionmentioning
confidence: 98%
“…The MOKE in a multilayer thin-film structure can be significantly altered by internal reflection at various interfaces. At normal incidence, r ± for N thin-films can be calculated using a 2 × 2 characteristic matrix method [11,43] in the LCP/RCP eigenmode basis: where β j = (2π/λ)n j d j is a phase factor, d j is the thickness of the j th layer and λ is the optical wavelength. The Fresnel reflection and transmission coefficients at normal incidence for each interface respectively are r ± j,j+1 = (n ± j − n ± j+1 )/(n ± j + n ± j+1 ) and t ± j,j+1 = (2n ± j )/(n ± j + n ± j+1 ).…”
mentioning
confidence: 99%