1955
DOI: 10.1103/physrev.98.368
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Cyclotron Resonance of Electrons and Holes in Silicon and Germanium Crystals

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Cited by 1,240 publications
(301 citation statements)
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“…6 where we plot the interband dipole moment 11 between the conduction-band and the valence-band ground states for the four different models as a function of h. In the models with strain we have a maximum around h = 5 nm while the dipole moments for the two models without strain grow monotonically with increasing height and eventually reach a plateau value corresponding to the bulk value of 16.8 Åe. The monotonic increase in the dipole moments can be understood based on Eq.…”
Section: Results: Band Structure and Dipole Momentsmentioning
confidence: 99%
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“…6 where we plot the interband dipole moment 11 between the conduction-band and the valence-band ground states for the four different models as a function of h. In the models with strain we have a maximum around h = 5 nm while the dipole moments for the two models without strain grow monotonically with increasing height and eventually reach a plateau value corresponding to the bulk value of 16.8 Åe. The monotonic increase in the dipole moments can be understood based on Eq.…”
Section: Results: Band Structure and Dipole Momentsmentioning
confidence: 99%
“…The dipole 46 is always the smaller of the two probe transitions and the fact that it drops off faster suggests that one should aim at using 11 , ground state to ground state, as probe transition.…”
Section: B Size/geometry Dependencementioning
confidence: 99%
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“…This assumption, however, is valid only for high concentration of oxygen vacancies. By analyzing the transport properties, assuming a six-fold degenerate conduction band and r ¼ 2 (scattering by impurity ions), Okuda et al 24 Conventionally, m* of semiconductors have been determined by the Shubnikov-de Hass effect, 25 optical methods, 26 photoemission spectroscopy, 27 and cyclotron resonance techniques, 28 or by solving the Boltzmann transport equation using a four coefficients method. 29 Alternatively, m* may also be determined using spectroscopic ellipsometry (SE).…”
mentioning
confidence: 99%