2012
DOI: 10.1016/j.nimb.2011.11.047
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Damage creation threshold of Al2O3 under swift heavy ion irradiation

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Cited by 31 publications
(27 citation statements)
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“…Therefore the track re-crystallization has only a minor effect. New measurements by Khalfaoui et al [12] and Skuratov et al [13] confirm our estimate for Al 2 O 3 .…”
Section: Discussionsupporting
confidence: 88%
“…Therefore the track re-crystallization has only a minor effect. New measurements by Khalfaoui et al [12] and Skuratov et al [13] confirm our estimate for Al 2 O 3 .…”
Section: Discussionsupporting
confidence: 88%
“…Several experimental techniques can be used to gather information on the electronic stopping power threshold or the size of the region damaged by irradiation like Rutherford backscattering spectrometry in channeling geometry [27,28], atomic force microscopy [29,30], profilometry [31], X-ray diffraction [32], Mössbauer spectroscopy [33], transmission electron microscopy [34,35]. Their results are most often partial and require indirect interpretation based on models with exception of transmission electron microscopy (TEM) that provides a direct access to morphological and structural information to the micro-to atom scale.…”
Section: Introductionmentioning
confidence: 99%
“…Al 2 O 3 exhibits material disordering and an easy amorphization at the surface since S e is above the threshold value S eth [2,[16][17][18][19][20][21][22][23][24][25]. Moreover, additional structural effects are independently reported in the literature, such as different sensitivities to disorder of O or Al sublattices [26], swelling [27], lattice deformation [28][29][30], or a complex track structure along the ion path [25,31].…”
Section: Introductionmentioning
confidence: 99%
“…With monoatomic ions, in the single impact regime, i. e. at low fluence without significant ion track overlapping, tracks are not fully amorphous. In this regime, a S eth for track generation necessarily refers to a threshold for a specific observed damage, and consequently may vary depending on the observations made, i. e. the TEM observations of changes along the ion track may provide a different threshold than the one by AFM observation of surface nanodots [20,25,27]. Full amorphization can be triggered with monoatomic ions only at high fluences, due to track overlapping, starting at the surface [18,22].…”
Section: Introductionmentioning
confidence: 99%