2020
DOI: 10.1016/j.joule.2020.03.003
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Damp-Heat-Stable, High-Efficiency, Industrial-Size Silicon Heterojunction Solar Cells

Abstract: Silicon heterojunction (SHJ) solar cells hold the power conversion efficiency (PCE) record among crystalline solar cells. However, amorphous silicon is a typical highentropy metastable material. Damp-heat aging experiments unveil that the amorphous/crystalline silicon interface is susceptible to moisture, which is potentially the biggest stumbling block for mass production. By capping SiN x and SiO x dielectrics, the absolute PCE degradation is predicted to be only 0.6% after a 30-year installation. This demon… Show more

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Cited by 68 publications
(38 citation statements)
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“…Hitherto, it is always a challenge to well passivate the device surface and effectively collect carriers simultaneously in rear‐emitter heterojunction c‐Si solar cells. [ 10,15,16 ] Improving the surface passivation without hindering carrier extraction from ITO is essential for further enhancement of the performance of heterojunction c‐Si solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…Hitherto, it is always a challenge to well passivate the device surface and effectively collect carriers simultaneously in rear‐emitter heterojunction c‐Si solar cells. [ 10,15,16 ] Improving the surface passivation without hindering carrier extraction from ITO is essential for further enhancement of the performance of heterojunction c‐Si solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…[ 3–7 ] Even though technologically SHJ solar cells are nowadays a relatively mature photovoltaic (PV) technology, the microscopic picture of the passivated a‐Si:H/c‐Si interface, critical in obtaining high operating voltages, is not yet complete. [ 8,9 ] Indeed, several fundamental questions about the a‐Si:H microstructure required to obtain a good passivation layer are still unresolved. Answering these might also give important hints to improve further other passivating‐contact technology beyond SHJ technology, such as those employing high‐temperature tolerant materials.…”
Section: Introductionmentioning
confidence: 99%
“…Similarly, the growth of TCO films is influenced by the nature of the doped silicon layer it grows on, with lower-conductivity films typically obtained on nc-Si:H films than on a-Si:H films for identical growth conditions as exemplified in Figure 1c [20], [40]. Then, although the addition of an SiOx (or SiNx) capping layer has been demonstrated as beneficial for multiple TCOs (ITO [33], tungsten-doped indium oxide [13], aluminum-doped zinc oxide [41]), this is still unexplored for IZrO, even less so for an IZrO layer grown on a nc-SiOx:H film. Lastly, little literature is available on the influence of the device architecture on the effect of a forward bias treatment.…”
mentioning
confidence: 98%
“…In all cases, it is possible to tune specific properties of the involved material to relax the trade-off. This can be the microstructure factor for the (i)a-Si:H layer [11]- [13], the electron mobility for the TCO [14]- [16], or the composition of the thin-film-silicon doped layer [17]- [19].…”
mentioning
confidence: 99%
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