2016 IEEE International Reliability Physics Symposium (IRPS) 2016
DOI: 10.1109/irps.2016.7574572
|View full text |Cite
|
Sign up to set email alerts
|

Data archiving in 1x-nm NAND flash memories: Enabling long-term storage using rank modulation and scrubbing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2016
2016
2018
2018

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…The more challenging aspect of residual errors is the treatment of secondary error types (e.g. the ones treated in [12]) in conjunction to the dominant asymmetric magnitude-1 errors. If these secondary errors are frequent enough to affect a significant fraction of NCC blocks, then the suggested concatenation with RS codes will not work, since many RS symbols would have residual errors left by the NCC decoder (which was not designed to combat these errors).…”
Section: The Ncc As An Ecc Scheme In Flash Memoriesmentioning
confidence: 99%
“…The more challenging aspect of residual errors is the treatment of secondary error types (e.g. the ones treated in [12]) in conjunction to the dominant asymmetric magnitude-1 errors. If these secondary errors are frequent enough to affect a significant fraction of NCC blocks, then the suggested concatenation with RS codes will not work, since many RS symbols would have residual errors left by the NCC decoder (which was not designed to combat these errors).…”
Section: The Ncc As An Ecc Scheme In Flash Memoriesmentioning
confidence: 99%