“…In the past, most industrial process monitoring (IPM) approaches were focused on fault detection, i.e., on the ability to detect a fault and reduce the time between a faults' occurrence and detection [7]. More recently, with concepts like zero-defect manufacturing gaining importance, the focus has shifted toward fault diagnosis and troubleshooting activities that consume a considerably larger portion of the process downtime [1,7] compared to fault detection activities. In this context, several data-driven [7][8][9][10][11], model-based [12][13][14], and statistical [15] approaches have been proposed to support Processes 2020, 8, 89 2 of 11 the identification of the underlying root cause of a fault.…”