Data processing for spectrum-images: extracting information from the data mountain

Prutton, M.; Wilkinson, D. K.; Kenny, Peter G.

doi:10.1016/s0169-4332(98)00754-5

Cited by 12 publications

(5 citation statements)

References 28 publications

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“…Images were collected over a range covering the Ni 2p 3/2 envelope of 848 eV-870 eV at an interval of 0.2 eV, using medium magnification (400 ð 400 µm), an 80 eV pass energy, imaging aperture 2, charge neutralizer set to 1.6 A, 2.8 eV, and a dwell time of 240 s. X-ray focusing was assisted by drilling two holes into the surface of the Ni metal to produce regions of zero photoelectron counts. Our procedure is similar to that used by Barkshire et al,18,19 Prutton et al, 20 Artyushkova and Fulghum, 21,22 Walton and Fairley, 23,24 and Smith, Briggs, and Fairley. 25 The image dataset was then processed using the CasaXPS software.…”

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confidence: 99%

Structure and growth of oxides on polycrystalline nickel surfaces

Payne

Grosvenor

Biesinger

et al. 2007

Surface & Interface Analysis

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The oxidation of polycrystalline nickel (Ni) metal surfaces after exposure to oxygen gas (O 2 ) at 25 and 300°C and pressures near 130 Pa, was studied using X-ray photoelectron spectroscopy (XPS). Oxide structures involving both divalent (Ni 2+ ) and trivalent (Ni 3+ ) species could be distinguished using Ni 2p spectra, while surface adsorbed O 2 and atomic oxygen (O) species could be differentiated from bulk oxide (O 2− ) using O 1s spectra. Oxide thicknesses and distributions were determined using QUASES  , and the average oxide thickness was verified using the Strohmeier formula. The reaction kinetics for oxide films grown at 300°C followed a parabolic mechanism, with an oxide thickness of greater than 4 nm having formed after 60 min. Exposure at 25°C followed a direct logarithmic mechanism with an oxide growth rate about four to five times slower than at 300°C. Reaction of a Ni (100) single crystal under comparable conditions showed much slower reaction rates compared to polycrystalline specimens. The higher reaction rate of the polycrystalline materials is attributed to grain boundary transport of Ni cations. Oxide thickness was measured on a microscopic scale for polycrystalline Ni exposed to large doses of O 2 at 25 and 300°C. The thickness of oxide was not strongly localized on this scale. However, the QUASES  analysis suggests that there is localized growth on a nanometric scale -the result of island formation. Copyright  2007 John Wiley & Sons, Ltd.KEYWORDS: X-ray photoelectron spectroscopy; nickel; oxidation; polycrystalline surfaces INTRODUCTIONThe oxidation of nickel (Ni) metal surfaces at ambient temperatures leads to the formation of thin passive films that tend to be described best using logarithmic kinetics. 1Following passivation there is little subsequent change in oxide thickness with time. 2 The mechanism is believed to follow that which was first suggested by Mott and Cabrera. 3 Reactant oxygen molecules (O 2 ) adsorb onto the surface of the metal and decompose into atomic oxygen (O (ads)). 4 The O (ads) then bonds covalently with the Ni metal atoms at the surface, weakening their attachment to the lattice. 4 Owing to the difference in electronegativity between Ni and O, a dipole forms which allows the two atoms to exchange places.4 Such a place exchange mechanism is responsible for the formation of the first one or two monolayers of oxide only. 4 Further oxidation is driven by the formation of an electric field created by the tunneling of electrons from the Ni atoms in the metal, through the thin oxide layer, to the O (ads) sitting on the surface. 1 The presence of this electric field induces the movement of ions through the oxide leading to the formation of a thicker film.1 After the film reaches a Ł Correspondence to: Brad P. Payne, Department of Chemistry, Room G-4, Western Science Centre, The University of Western Ontario, London, ON N6A 5B7, Canada. E-mail: bpayne2@uwo.ca certain thickness, the electric field is no longer strong enough to promote ion diffusion and oxidation sto...

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confidence: 99%

Structure and growth of oxides on polycrystalline nickel surfaces

Payne

Grosvenor

Biesinger

et al. 2007

Surface & Interface Analysis

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“…(b) versatile analytical instruments, with which several analytic signals can be recorded simultaneously, have also been built. An example is the multispectral Auger microscope built in York (Prutton et al, , 1999. (c) some small instruments can also be put inside others, allowing a large magnification range to be covered: near-field microscopes have been put inside SEMs.…”

Section: Multimodal Microscopy and Data Fusionmentioning

confidence: 99%

Some trends in microscope image processing

Bonnet

2004

Micron

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“…3 have used parallel acquisition to investigate the use of multivariate analysis applied to XPS multi-spectral data sets, a procedure first applied by Prutton 4 to image data sets acquired using scanning Auger microscopy. Artyushkova and Fulghum acquired a range of images incremented in energy, and constructed a multispectral data set by converting the images to a spectrum at each pixel in the image.…”

Section: Artyushkova and Fulghummentioning

confidence: 99%

Quantitative surface chemical‐state microscopy by x‐ray photoelectron spectroscopy

Walton

Fairley

2004

Surface & Interface Analysis

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The realization of surface chemical-state microscopy by x-ray photoelectron spectroscopy requires the resolution of overlapped chemical states, an adequate background description and the ability to quantify data. This can be achieved only by the acquisition and analysis of multi spectral data sets. Here we describe the software to perform this analysis, which is capable of allowing for small amounts of differential charging and for incorporation of knowledge about the sample. We demonstrate its use on a patterned silicon dioxide on silicon sample, and suggest ways to reduce oversampling and therefore acquisition times.

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Data processing for spectrum-images: extracting information from the data mountain

Cited by 12 publications

References 28 publications

Structure and growth of oxides on polycrystalline nickel surfaces

Structure and growth of oxides on polycrystalline nickel surfaces

Some trends in microscope image processing

Quantitative surface chemical‐state microscopy by x‐ray photoelectron spectroscopy

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