2007
DOI: 10.1016/j.jallcom.2006.06.046
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DC-conduction mechanism in crystalline oxidised La and La–Mn films grown on p-Si substrate

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Cited by 3 publications
(2 citation statements)
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References 38 publications
(52 reference statements)
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“…The author reported preliminary results from in situ XRF and ex situ XRD to further an understanding of the growth mechanism of the thin alloy film. A prolific author in this area, Dakhel 299 published information on conduction mechanisms in crystalline oxidised La and La-Mn films grown on p-type Si substrates using both XRF and XRD derived data. The author demonstrated that the addition of Mn oxide to La oxide, that almost terminated the hygroscopic products, neither changed the DC-conduction nature of the film, nor improved the insulating quality of pure La 2 O 3 .…”
Section: Thin Films and Coatingsmentioning
confidence: 99%
“…The author reported preliminary results from in situ XRF and ex situ XRD to further an understanding of the growth mechanism of the thin alloy film. A prolific author in this area, Dakhel 299 published information on conduction mechanisms in crystalline oxidised La and La-Mn films grown on p-type Si substrates using both XRF and XRD derived data. The author demonstrated that the addition of Mn oxide to La oxide, that almost terminated the hygroscopic products, neither changed the DC-conduction nature of the film, nor improved the insulating quality of pure La 2 O 3 .…”
Section: Thin Films and Coatingsmentioning
confidence: 99%
“…, which is lower than that of identically prepared pure La oxide of about 3.1 10 × 7 [25]. However, second set of films of 7 %Au were found to be conducting of resistivity about 1.6…”
Section: Methodsmentioning
confidence: 67%