2004
DOI: 10.1016/j.physb.2004.03.249
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DC electric and photoelectric measurements of CdTe thin films in Schottky-barrier cells

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Cited by 21 publications
(8 citation statements)
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“…Also it is close to the value calculated by Ubale et al [21] (22 nm) for CdTe thin films prepared by chemical deposition method: successive ionic layer adsorption and reaction (SILAR). But our value of grain size is smaller than the values obtained by Darwish [18], which ranged between 79 and 125 nm for thermal evaporated CdTe thin films. The reason of this large difference is that our films were prepared at ambient temperature, while those of Darwish [18] were prepared at 670 K; it is well known that grain size increases with deposition temperature.…”
Section: Structural Propertiescontrasting
confidence: 88%
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“…Also it is close to the value calculated by Ubale et al [21] (22 nm) for CdTe thin films prepared by chemical deposition method: successive ionic layer adsorption and reaction (SILAR). But our value of grain size is smaller than the values obtained by Darwish [18], which ranged between 79 and 125 nm for thermal evaporated CdTe thin films. The reason of this large difference is that our films were prepared at ambient temperature, while those of Darwish [18] were prepared at 670 K; it is well known that grain size increases with deposition temperature.…”
Section: Structural Propertiescontrasting
confidence: 88%
“…But our value of grain size is smaller than the values obtained by Darwish [18], which ranged between 79 and 125 nm for thermal evaporated CdTe thin films. The reason of this large difference is that our films were prepared at ambient temperature, while those of Darwish [18] were prepared at 670 K; it is well known that grain size increases with deposition temperature. Fig.…”
Section: Structural Propertiescontrasting
confidence: 88%
See 1 more Smart Citation
“…This large n value can be explained in terms of the interface states and series resistance. The obtained n value suggests that the charge transport mechanism is controlled by recombination in the space charge region [16].…”
Section: Resultsmentioning
confidence: 81%
“…As an alternative to p/n junction solar cells, Metal/Semiconductor (MS) and its deviated structure of Metal/Insulator/Semiconductor (MIS) Schottky barrier solar cells are often used for fabricating solar cells owing to their simple structure and fabrication process, limited problems from the interface states for heterostructure introduced by semiconductor lattice mismatch etc, low temperature processing and reasonably good efficiencies [18][19][20][21][22][23][24][25]. Various designs of Schottky diode structures and the effects of each semiconductor layer, metal electrode and electrode pattern on the performances have been systematically studied and explored for various material systems [26][27][28].…”
Section: Momentioning
confidence: 99%