De-embedding zero-field signal in high-frequency magneto-impedance measurements of soft ferromagnetic materials

Kilinc, Muhammed; García, Carlos; Eginligil, Mustafa; Wang, J.; Huang, Wei

doi:10.1016/j.jmmm.2019.02.021

Cited by 3 publications

(4 citation statements)

References 35 publications

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“…The accuracy of the customized calibration methods critically depends on the tolerance of calibration standards fabrication (for example, the lumped open, short, etc., terminations) and the problem becomes more essential with increasing frequency. Relating to this, an alternative of VNA calibration technique for MI measurements at a high frequency was recently introduced in [ 26 ] using zero-field de-embedding method. In this method, the MI measurements obtained at zero magnetic field were used as a reference signal, and then the same process was repeated with applied magnetic field so that the data could be subtracted by the values of the reference signal.…”

Section: Introductionmentioning

confidence: 99%

High-Frequency Magnetoimpedance (MI) and Stress-MI in Amorphous Microwires with Different Anisotropies

et al. 2021

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Magnetoimpedance (MI) in Co-based microwires with an amorphous and partially crystalline state was investigated at elevated frequencies (up to several GHz), with particular attention paid to the influence of tensile stress on the MI behavior, which is called stress-MI. Two mechanisms of MI sensitivity related to the DC magnetization re-orientation and AC permeability dispersion were discussed. Remarkable sensitivity of impedance changes with respect to applied tensile stress at GHz frequencies was obtained in partially crystalline wires subjected to current annealing. Increasing the annealing current enhanced the axial easy anisotropy of a magnetoelastic origin, which made it possible to increase the frequency of large stress-MI: for 90mA-annealed wire, the impedance at 2 GHz increased by about 300% when a stress of 450 MPa was applied. Potential applications included sensing elements in stretchable substrates for flexible electronics, wireless sensors, and tunable smart materials. For reliable microwave measurements, an improved SOLT (short-open-load-thru) calibration technique was developed that required specially designed strip cells as wire holders. The method made it possible to precisely measure the impedance characteristics of individual wires, which can be further employed to characterize the microwave scattering at wire inclusions used as composites fillers.

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Section: Introductionmentioning

confidence: 99%

High-Frequency Magnetoimpedance (MI) and Stress-MI in Amorphous Microwires with Different Anisotropies

et al. 2021

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“…However, if a premature transition is exhibited caused by an error in the delay time, this will cause the real part to grow again, which will be noticeable. Ignoring these physical conditions makes impedance measurements practically useless [30]. An adjustment algorithm for the delay time is used here and available at GitHub repository in the folder Impedance dispersion [44].…”

Section: Surface Impedance Of Ferromagnetic Wires As a Boundary Condi...mentioning

confidence: 99%

“…Such plethora of functional materials and their increasing trend towards operating at broader bandwidth stimulate the development of accurate measurement techniques to characterize their MI and microwave behaviour. The most commonly used methods are based on shorted coaxial transmission lines [25][26][27], microstrip transmission lines (MTLs) and coplanar waveguides (CPWs) etched on printed circuit boards (PCBs) [28][29][30][31][32] aided by vector network analysers (VNAs). In the shorted coaxial lines, one end of the microwire is connected to the inner conductor, while the other end is connected to the ground of the coaxial cap.…”

Section: Introductionmentioning

confidence: 99%

“…VNA and the cables can be calibrated using the standard 12-term error correction model with the coaxial SHORT-OPEN-LOAD-THRU (SOLT) terminations. The strip waveguides must be deembedded based on different methods [28,30,31,34]. In turn, an elongated sample over a continuous ground (or segment of a loaded strip) constitutes a structure which waveguide properties must be considered when calculating material parameters from the S-parameter measurements.…”

Section: Introductionmentioning

confidence: 99%

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Broadband measurements of the surface impedance in ferromagnetic wires as a boundary condition for scattering problems

Uddin

Qin

Estévez

et al. 2023

Meas. Sci. Technol.

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In the cm-wave range, the skin depth is comparable to the micron radius of ferromagnetic wires and thus their magnetic and conductive properties will influence the scattered electromagnetic field. Solving the scattering problem by considering the complicated internal magnetic structure of the wire becomes unpractical. There is a need to develop hybrid methods when the external problem of scattering on an inclusion is solved together with the experimental impedance conditions on its surface. Herein, we propose an accurate broadband impedance measurement technique operating up to 15 GHz. The PCB measurement and calibration cells designed in this work allow flexibility in choosing external stimuli such as magnetic field, tensile stress, and heat. The experimental impedance can be then used as the boundary condition in electromagnetic simulations making it possible to model, predict and design wire-based composites using numerical solvers such as CST Studio Suite.

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Cylindrical micro and nanowires: Fabrication, properties and applications

Alam

Bran

Chiriac

et al. 2020

Journal of Magnetism and Magnetic Materials

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De-embedding zero-field signal in high-frequency magneto-impedance measurements of soft ferromagnetic materials

Cited by 3 publications

References 35 publications

High-Frequency Magnetoimpedance (MI) and Stress-MI in Amorphous Microwires with Different Anisotropies

High-Frequency Magnetoimpedance (MI) and Stress-MI in Amorphous Microwires with Different Anisotropies

Broadband measurements of the surface impedance in ferromagnetic wires as a boundary condition for scattering problems

Cylindrical micro and nanowires: Fabrication, properties and applications

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