1981
DOI: 10.1016/0022-4596(81)90440-0
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De´termination pre´cise de la structure de la chiolite Na5Al3F14 ete´tude par R.P.E. de Na5Al3F14:Cr3+

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Cited by 71 publications
(51 citation statements)
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“…The most complex tellurate layer type has corner-sharing of Q 2400 and Q 4200 octahedra to form a layer with overall stoichiometry Te 3 X 14 ( Fig. 14d), with the same topology as that seen in chiolite, Na 5 (Al 3 F 14 ) (Jacoboni et al, 1981).…”
Section: -362mentioning
confidence: 94%
“…The most complex tellurate layer type has corner-sharing of Q 2400 and Q 4200 octahedra to form a layer with overall stoichiometry Te 3 X 14 ( Fig. 14d), with the same topology as that seen in chiolite, Na 5 (Al 3 F 14 ) (Jacoboni et al, 1981).…”
Section: -362mentioning
confidence: 94%
“…The two independent Na + ions are located at 00½ and, approximately, at ~1 ~" ~;, layers of octahedra are hence separated by cations. Failure to generate second harmonics confirms the centrosymmetric choice of space group at room temperature (Jacoboni et al, 1981). Chiolite is reported to undergo a phase transition at 150K (Rocquet, Couzi, Tressaud, Chaminade & Hauw, 1985).…”
Section: Structural Discussionmentioning
confidence: 83%
“…Both polyhedra are also associated with two additional O,F atoms, at Na--O,F distances greater than 2.8A. In the case of NasAI3F14, one Na is eight-coordinated with a unique Na-F distance of 2.583 A; the second independent Na atom is sixcoordinated with two Na-F distances of 2.268 A, two of 2-290 A and two of 2.583 A (Jacoboni et al, 1981).…”
Section: Structural Discussionmentioning
confidence: 98%
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“…Os padrões de difração de raios X para as argilas e materiais híbridos, exibidos nas figuras 25 e 26, apresentam perfis semelhantes em todos os casos, sendo estes atribuídos a um difratograma de raios X característico de argilas beidelitas [52], visualizando a presença das reflexões referentes aos planos (001), (hkl) (I) (hkl) [79]. Essa impureza é formada durante a síntese da beidelita em meio contendo fluoreto, e pode ser removida das amostras através de lavagem com água e posterior centrifugação ou filtração.…”
Section: Difratometria De Raios X (Drx)unclassified