2016
DOI: 10.1103/physrevx.6.031035
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Defect Control of Conventional and Anomalous Electron Transport at Complex Oxide Interfaces

Abstract: Using low-temperature electrical measurements, the interrelation between electron transport, magnetic properties, and ionic defect structure in complex oxide interface systems is investigated, focusing on NdGaO 3 =SrTiO 3 (100) interfaces. Field-dependent Hall characteristics (2-300 K) are obtained for samples grown at various growth pressures. In addition to multiple electron transport, interfacial magnetism is tracked exploiting the anomalous Hall effect (AHE). These two properties both contribute to a nonli… Show more

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Cited by 69 publications
(122 citation statements)
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References 85 publications
(175 reference statements)
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“…The (4, 2) heterostructure presents two channels of electrons: one with lower-mobility µ I = 3600 cm 2 V −1 s −1 , n I = 1.7 × 10 13 cm −2 and one with higher mobility µ II = 80 000 cm 2 V −1 s −1 , n II = 9.3 × 10 12 cm −2 . Higher mobility values are observed for lower carrier densities, consistent with previous studies of STO-based 2DES [30]. We note that the sheet resistance of the higher-mobility channel ρ II is one order of magnitude smaller than ρ I , suggesting that it dominates the low-temperature transport.…”
supporting
confidence: 91%
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“…The (4, 2) heterostructure presents two channels of electrons: one with lower-mobility µ I = 3600 cm 2 V −1 s −1 , n I = 1.7 × 10 13 cm −2 and one with higher mobility µ II = 80 000 cm 2 V −1 s −1 , n II = 9.3 × 10 12 cm −2 . Higher mobility values are observed for lower carrier densities, consistent with previous studies of STO-based 2DES [30]. We note that the sheet resistance of the higher-mobility channel ρ II is one order of magnitude smaller than ρ I , suggesting that it dominates the low-temperature transport.…”
supporting
confidence: 91%
“…Upon warming, n I maintains an almost constant value, while n II undergoes a sharp drop above 10 K and subsequently disappears. This disappearance might be due to the activation of interband scattering processes at higher temperatures, which cause a mixing of ρ I , ρ II , so that their populations cannot be independently resolved in Hall effect measurements [30]. Another possible interpretation for this trend is that the two conduction channels are situated in STO at two different distances from the interface.…”
mentioning
confidence: 99%
“…It is this feature that leads to the deep pit of the Hall coefficient. This is in sharp contrast to NdGaO 3 /STO [24] [blue curves in Fig. 2(d)] or LAO/EuTiO 3 /STO [23], for which R AHE owns the same sign as the applied field.…”
Section: Resultsmentioning
confidence: 76%
“…2(a) of Ref. [24]. The normal and anomalous Hall resistances have been determined by the technique described there.…”
Section: Resultsmentioning
confidence: 99%
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