2016
DOI: 10.1016/j.solener.2016.03.057
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Defect distribution in InGaAsN/GaAs multilayer solar cells

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Cited by 20 publications
(14 citation statements)
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“…Therefore, the growth of dilute nitrides has been scarcely studied in an atmospheric pressure metal organic vapour phase epitaxy (AP-MOVPE) [10,11], which is a challenge for growers, but allows the reduction of the production cost of MJSCs based on these metastable compounds. Our earlier experiments [12][13][14][15] indicated a high In/N composition ratio (10 ÷ 30) in InGaAsN alloys grown by AP-MOVPE. Consequently it was impossible to obtain thick (~ 1 µm) layers with good material quality.…”
Section: Introductionmentioning
confidence: 82%
“…Therefore, the growth of dilute nitrides has been scarcely studied in an atmospheric pressure metal organic vapour phase epitaxy (AP-MOVPE) [10,11], which is a challenge for growers, but allows the reduction of the production cost of MJSCs based on these metastable compounds. Our earlier experiments [12][13][14][15] indicated a high In/N composition ratio (10 ÷ 30) in InGaAsN alloys grown by AP-MOVPE. Consequently it was impossible to obtain thick (~ 1 µm) layers with good material quality.…”
Section: Introductionmentioning
confidence: 82%
“…Dilute nitride semiconductors alloys, i.e., arsenides, phosphides or antimonides, with the addition of a small amount of nitrogen, are an attractive material for both laser [1][2][3] and photovoltaic [4][5][6][7][8][9][10][11] communities. A nitrogen atom with a high electronegativity of 3.04, according to the Pauling scale, induces an impurity level close to the conduction band of the matrix material.…”
Section: Introductionmentioning
confidence: 99%
“…[23] Study of defect distribution in InGaAsN/GaAs multilayer solar cells indicated that all structures showed a variety of deep energy levels with high concentrations and the electron trap state associates with a defect containing two nitrogen atoms on the lattice site. [24] Based on the literatures, it was found that the effects of InÀ N distribution on electronic properties of InGaAsN under high pressure are still ambiguous and need further investigation. In this report, we therefore study the effects of InÀ N interaction in In x Ga 1-x As 0.963 N 0.037 with the concentrations of x = 0.074, 0.111 and 0.148, which relate to the ratio in experiments (In : N = 1 : 0.35 � 3 : 1).…”
Section: Introductionmentioning
confidence: 99%
“…The p‐i‐n structures of GaAs/InGaAsN were grown on Ge substrate by low‐pressure MOVPE and it was found that the photo‐current edge of InGaAsN (In=10.3 % and N=3.3 %) with 1 eV bandgap shifted to longer wavelength . Study of defect distribution in InGaAsN/GaAs multilayer solar cells indicated that all structures showed a variety of deep energy levels with high concentrations and the electron trap state associates with a defect containing two nitrogen atoms on the lattice site …”
Section: Introductionmentioning
confidence: 99%