Defect formation and optical activation of Tb implanted AlxGa1−xN films using channeled implantation at different temperatures

Confronting Vegard’s rule in Ge1−x Sn x epilayers: from fundamentals to the effect of defects

“…Related to the former, it is first time the software is presented as final version to the scientific community. The latter, acronym for multiple reflection optimization package for XRD, in its single reflection mode has been often used for the simulation (and fitting) of the 2θ-ω scans using the dynamical theory of XRD [32][33][34][35][36][37][38] while the multiple reflection mode has been recently presented [38]. The code employs the dynamical theory of XRD and considers the effects of the instrumental function and the presence of Cu Kα 2 .…”

Crystal mosaicity determined by a novel layer deconvolution Williamson–Hall method

“…[54][55][56] Additional information about the crystalline quality of the AlGaN samples obtained via Rutherford backscattering/channelling and transmission electron microscopy can be found in ref . 42 The films show high single crystalline quality and the dominant defects are threading dislocations as typically found in III-nitride heteroepitaxial films. Parallel and perpendicular to the sample surface lattice parameters were confirmed using reciprocal space mapping of an asymmetrical reflection, in this case , at the glancing incident angle geometry.…”

“…Several publications using previous version of this software can be found. [40][41][42] The simulation is accomplished using the recursive formalism described in ref. 57 based on the dynamical theory of X-ray diffraction.…”

“…The earlier version of MROX, only targeted single reflections and with no name attributed was used in the work presented in refs. 35,[40][41][42][43][44] Finally, the LdCWH method is the main subject of this manuscript whose software description is addressed to 45 .…”

“…Figure1 a-c) Experimental and simulation of the 2- scans around the vicinities of the Al 0.18 Ga 0.82 N 0002, 0004, and 0006 Bragg peaks. The simultaneous simulations and fittings were accomplished using the MROX code[40][41][42] . d) Schematics of the top Al 0.18 Ga 0.82 N surface layers with the corresponding layer thickness, deformation perpendicular to the sample surface (  ) and crystalline quality (DW).…”