“…[17][18][19][20][21][22] In order to circumvent the issue, several technologies, such as buffer layer, epitaxial lateral overgrowth, pattern design of the Si substrates, etc., need to be used. [44][45][46][47][48][49][50][51] These technologies can reduce dislocation density and release the stress to some extent, and eventually benefit the growth of high-quality Al films on Si substrates. [44][45][46][47][48][49][50][51] Therefore, these pieces of evidence show the higher crystalline quality of Al epitaxial film grown in this work.…”