Defect structure analysis of polycrystalline materials by computer -controlled double-crystal diffractometer and position-sensitive detector

Mayo, W. E.; Yazici, Rahmi; Takemoto, T.; Weissmann, S.

doi:10.1107/s0108767381092088

Cited by 2 publications

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“…A nondestructive analysis of long-range plastic strains and associated deformation gradients of a tensile deformed notched specimen has been carried out to illustrate the usefulness of this technique (Mayo, Yazici, Takemoto & Weissmann, 1981). A solution-annealed 304 stainless steel (18Cr, 8Ni) notched tensile specimen with the geometry shown in Fig.…”

Section: Quantitative Mapping Of Deformation Gradientsmentioning

confidence: 99%

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

Yazici¹,

Mayo²,

Takemoto³

et al. 1983

J Appl Cryst

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The method represents an extension of a previously developed X-ray double-crystal diffractometer method when a film was used to record the crystallite reflections, each reflecting crystallite being regarded as the second crystal of a double-crystal diffractometer. By utilizing a position-sensitive detector (PSD) with interactive computer controls, the tedious and limiting task of data acquisition and analysis is greatly simplified. The specimen is irradiated with crystalmonochromated radiation and the numerous microscopic spots emanating from the reflecting crystallites are recorded separately by the position-sensitive detector and its associated multichannel analyzer at each increment of specimen rotation. An on-line minicomputer simultaneously collects these data and applies the necessary corrections. This process is then automaticaIly repeated through the full rocking-curve range. The computer carries out the rocking-curve analysis of the individual crystallite reflections as well as that of the entire reflecting crystallite population. The instrument is provided with a specimen translation device which permits analysis of large sections of solid specimens. Thus, sites of local lattice defects induced either mechanically, chemically or by radiation can rapidly be established and quantitatively determined in terms of rocking-curve parameters as well as imaged by X-ray topography, by inserting a film in front of the PSD. The versatility and usefulness of the method is demonstrated by examples given from studies of fracture, fatigue and stress-corrosion cracking of commercial alloys.

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Section: Quantitative Mapping Of Deformation Gradientsmentioning

confidence: 99%

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

Yazici¹,

Mayo²,

Takemoto³

et al. 1983

J Appl Cryst

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X-Ray Measurements of Long-Range Strains: A Bridge Between Micromechanics and Macromechanics

Weissmann

Kálmán

Chaudhuri

et al. 1982

Residual Stress and Stress Relaxation

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Defect structure analysis of polycrystalline materials by computer -controlled double-crystal diffractometer and position-sensitive detector

Abstract: graphic contrast analysis. In some crystals inclusion like features were observed in the topographs. These are apparently inclusions of the flux materials.

Cited by 2 publications

References 0 publications

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

X-Ray Measurements of Long-Range Strains: A Bridge Between Micromechanics and Macromechanics

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